Used TERADYNE J750 #9265116 for sale

TERADYNE J750 is a high speed and high accuracy digital final test equipment. It is designed for complex device and semiconductor testing, offering unmatched package coverage and high speed throughput. TERADYNE J 750 is built to be flexible, supporting a range of configurations and a variety of tests, both existing and new, including design of experiments, complex characterization and diagnostic tests. J750 is built for maximum efficiency and rapid results. Each system is configured with the highest performance and productivity, helping to maximize the throughput and integration of test processes. Its architecture provides the highest level of accuracy, while the direct high density signal connections allow the user to switch high power, AC and DC signals quickly and accurately. The unit is designed for use with the latest, high-speed ATE technologies, including the latest test handler, probers and MEMS test solutions. The powerful software architecture of J 750 includes a set of tools for designing and creating process flows, test programs, and for debugging test modules. The software is also designed for use with multiple types of devices, including MEMS, laser rangefinders, barcode scanners, and imaging components. Its built-in database helps to simplify and speed up device characterization. The machine also offers advanced test management and diagnostics tools, including 3D visualization, integration and reporting tools, and statistical process control. This powerful software platform allows users to develop complex tests and characterization solutions quickly and accurately. The tool is easy to use and configure, making it ideal for a wide range of applications. TERADYNE J750 is supported by a variety of manufacturers and offers a high level of scalability, making it suitable for both small and large scale production processes. The asset can be integrated with other systems and with external test systems, providing additional flexibility. TERADYNE J 750 is a powerful, flexible and efficient digital final test model that is an ideal solution for complex device and semiconductor testing. It offers the highest level of accuracy and speed, while its advanced software architecture makes it suitable for a variety of test scenarios. The equipment is designed to provide rapid results and maximum efficiency, helping to speed up production processes.