Used TERADYNE J750 #9265304 for sale
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TERADYNE J750 Final Test Equipment is an advanced, high performance tester designed to meet the needs of manufacturers of today's most complex SoC devices. TERADYNE J 750 is an advanced tester that combines scalable hardware and software designed with system-level architecture and high-speed performance analysis to enable efficient high-productivity test. It supports up to 16 test sites, with configurable options for up to four million digital channels and 200 million digital scan test. To reduce test time, J750 provides advanced diagnostics and high-speed parametric features, such as accelerated mode testing, advanced synchronization and clock reset capabilities, through-silicon-via (TSV) support, programmable test head technology, and Real-Time Test Reports. The tester is highly scalable, providing power and accuracy for future technologies. It supports a wide range of SoC memory technologies, such as DRAM, SRAM, Flash, and PCI Express, as well as mixed-signal device testing. Its low-power mode enables automatic test and debug even at the lowest power settings. The power and performance of J 750 make it ideal for demanding high-end device testing. The tester is suitable for a variety of applications, including high-volume test solutions, low-cost testing solutions, and custom unit-on-chip (SoC) device testing. TERADYNE J750 is also designed with advanced features such as advanced data logging, on-chip parametric testing, and embedded interface features. Its powerful debug capabilities include real-time tracing, statistical analysis, and reporting. TERADYNE J 750 also features powerful machine integration and automation features. It supports custom interfaces via XML, Web services, and remote access. In addition, it is equipped with a user-friendly visual tool builder that allows for rapid building of test programs and integration of components. J750 is an ideal tester for handling the increasingly complex device technology and designs of today's SoC devices. With its scalability, performance, diagnostic capabilities, and integration features, it is an ideal selection for today's manufacturers.
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