Used TERADYNE J750 #9267828 for sale

TERADYNE J750 is the latest and most reliable test equipment on the market for final test applications. This system is tailored for Solder Paste, SMT, and Final Test applications and features a highly reliable, Software Based Fault Coverage (SFBC) based test architecture. The SFBC technology improves test cell capacity and reduces downtime by helping to rapidly detect and isolate test issues. TERADYNE J 750 has a newly designed, space-saving controller and fully integrated magazine loader, which allows for quick and conscious testing of complex components over a broad range of test configurations. It also includes high-precision pin electronics, advanced current & voltage measurement techniques, and the latest interfacing methods. The unit is equipped with a powerful software package that offers programming flexibility and robust in-machine diagnostics. This software allows users to determine which tests are necessary and how they'd like to execute them quickly and efficiently. With this tool, users can perform high-speed analysis and access yield data on a great variety of test pins. The TestJet software also allows users to customize the test flow based on their desired output. J750 is designed for industry-standard protocols and standards such as I2C, SPI, JTAG, UART, etc. Moreover, it supports a variety of communication interfaces such as USB, RS-232, Ethernet, and GPIB. This allows users to interact with the asset in a variety of ways. The environmental conditions and model configuration can also be easily modified with the help of J 750. This equipment has a temperature range of -10°C to +50°C and a barometric pressure range of 500 - 1100 mB; it also has integrated air filtering and a differential pressure transducer. TERADYNE J750 final test system is an efficient and reliable production test solution that offers increased test throughput, cost savings, and improved test coverage. With its integrated hardware, software and services, it is the ideal tool for any production test environment.