Used TERADYNE J750 #9309468 for sale

TERADYNE J750 Final Test Equipment is a leading-edge, automated test and inspection platform for the semiconductor industry. It is a modular system offering highly flexible test and inspection capabilities, with greater accuracy and repeatability than ever before. TERADYNE J 750 is designed to perform a variety of test and inspection operations on a wide range of ICs, including microcontrollers, embedded processors, FPGAs, optical components, memory, and other low-power, monolithic ICs. Test and inspection operations include electrical, functional, boundary scan, defect inspection, and signal integrity analysis. The robust architecture of J750 provides high levels of accuracy and repeatability. This is due to its sophisticated test sequencing and reporting systems, advanced error correction and diagnostic capabilities, and industry-leading hardware, software, and connector components. This combination of features allows J 750 to perform high volume inspections at an extremely low cost. TERADYNE J750 also features on-board resources for diagnostics and repair. Through its sophisticated throughput monitoring, off-line diagnostics, and remote diagnostics tools, TERADYNE J 750 provides quick feedback to engineers whenever needed. The unit can be operated in multiple languages, with multi-language support for viewing the results and logs. An intuitive GUI simplifies the user interface, allowing operators to easily configure test sequences and conduct traceability activities. On-board resources for security and authentication also provide added protection against external tampering and unauthorized operations. The machine is continuously updated by renowned third-party vendors to provide comprehensive security and authentication throughout the life cycle of J750. Overall, J 750 Final Test Tool offers an industry-leading combination of performance, accuracy, and cost-effectiveness. With its advanced features and capabilities, TERADYNE J750 is the perfect choice to meet the test and inspection needs of today's highly competitive semiconductor industry.