Used TERADYNE J750 #9314722 for sale
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ID: 9314722
Vintage: 2001
Tester
Test head frame: 512
64 Pin / Channel card
(8) Cards
512 Channels
LVM 16 M
Date rate: 100 MHz
Edge placement accuracy: ± 500 Ps
(2) DPS (8 Channels / board)
IGXL: 3.40.13
Workstation: Pentium-Xeon
Computer: XW8400 / Z800
Tester and handler communication: DIO Handler
With I/F board PCIT (918-338-20)
YAC Manipulator
2001 vintage.
TERADYNE J750 Final Test Equipment is a high-speed, high efficiency test system that offers accurate and reliable data for a variety of components, such as semiconductor devices, digital integrated circuits, and digital signal processors. It is ideal for testing a wide range of electronics, including automotive, consumer, and industrial applications. TERADYNE J 750 is built on a rugged, modular architecture that enables precise and repeatable test results. It has a test capacity of up to 2,500 test points with high speed, low voltage probing, and dual channel LVDS capability. The unit's support for multiple power levels, signal paths, and video signals makes it suitable for a variety of components. Its versatile testing architecture supports efficient machine configurations and fast debug algorithms to speed up testing process. J750 has precise test capability, which enables it to give tight control and confidence that the component will perform correctly in the target application. This is especially important for high reliability applications, such as automotive and aerospace components where standards such as JEDEC, CE, and ISO must be met. J 750 can test all elements of a component such as logic, timing, signal integrity, and power consumption. The tool is also supported by powerful development and debugging tools to streamline test development and debugging processes. These include an integrated test generator, which simplifies the process of creating robust tests that are specific to a component. It also includes a compiler and an assembler, which enable writing programs for custom test algorithms and enable developers to create low-level test programs. TERADYNE J750 also offers dynamic link library support, which enables users to combine test resources into standardized library components. TERADYNE J 750 also makes it easy to access and manage test results, which can be viewed as graphical reports. The report format allows users to analyze data quickly and act on results. It also provides traceability to ensure that all tests and results can be tracked, verified, and archived. Overall, J750 Final Test Asset is suitable for a variety of test and validation purposes. Its accurate and repeatable tests, powerful development and debugging tools, and reliable test results make it an ideal solution for testing components in a variety of industries.
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