Used TERADYNE J750 #9315889 for sale

TERADYNE J750 is a final test equipment designed to provide cost-effective, scalable test solutions for high complexity designs and device/connectivity applications. The system offers an optimized combination of analogue, digital, MEMS, RF and optical test technology, as well as high-capacity in-circuit testing, to provide the ultimate coverage for all testing applications. TERADYNE J 750 Final Test unit is supported by an extensive suite of application software and design tools, allowing the machine to interface with customers' existing test environment and existing test equipment. At the core of the tool lies a high speed controller, delivering up to 32 Giga sample per second (Gsps), whilst handling up to 1,024 pins and 16 non-pin I/O channels, resulting in a asset with superior performance and low overhead. J750 also features sophisticated internal Automatic Test Pattern Generation (ATPG) algorithms for the Analog, Digital, MEMS and RF test channels, allowing maximum test coverage. The Dynamic but Efficient test patterns also allow for a low-power testing environment, making J 750 an ideal choice for power hungry applications. The on-board Smart Memory and Ethernet connectivity provides another advantage over competing solutions, allowing customers to integrate their existing test programs with an easy to manage software library. Furthermore, TERADYNE J750 features an in-built waveform generator that is capable of generating up to 20 different kinds of waveforms in both the Analog and Digital domains, enabling faster, more comprehensive debugging and production testing. TERADYNE J 750 also features advanced Fault Cover Analysis (FCA) with automated fault mapping and crosstalk/skew detection, assisting with the analysis of complex design failures. The Fault Isolation Stress Test (FIST) capability also increases the reliability of test results reducing false fails, fail-to-finds and probing-induced faults. Additionally, J750 leverages the patented "Loop-Through" test architecture, which enables advanced testing of multi-channel devices quickly and effectively. To conclude, J 750 R750 is a comprehensive, cost-effective and reliable final test model designed for both IoT/connectivity applications and complex device designs. Features include automated ATPG, intelligent memory, a variety of waveform generators, FCA capabilities, FIST, loop-through testing and advanced test software, allowing for integrated test development and smooth integration with existing test environments.