Used TERADYNE J750 #9374920 for sale

TERADYNE J750 is a fully automated, high speed, final test equipment suitable for the testing of high-volume, high-density semiconductor devices. This system is designed to significantly reduce test time, minimize operator involvement and ensure the highest quality of device test and debug. TERADYNE J 750 is a computer controlled, fully automated unit, designed to handle both single die and wafer testing with no manual intervention. It is a high-throughput automated test machine equipped with a multi-probe device tester and a non-contact oscilloscope that combine to provide fast, accurate testing of integrated circuits and devices. The tool includes an RF measurement asset and high-power voltage meter to provide additional test capabilities. The model's greatly enhanced speed reduces test times and improves throughput. J750 tester is equipped with a multi-probe testing station, a high-speed non-contact oscilloscope, a digital control equipment and an RF measurement system which allows the unit to test multiple die simultaneously while also providing a flexible test solution. The machine has extensive test coverage that allows it to accurately measure complex device characteristics up to 6GHz. The multi-probe testing station allows for fast, accurate testing of multiple die simultaneously, giving J 750 a maximum throughput of 600 DUT's per hour. This improved throughput significantly reduces the time to test and debug a device, thus reducing test time and cost. The multi-probe arm also provides an alternative method for testing non-standard shaped or packaged devices. TERADYNE J750 also has an automated sequence controller which allows for efficient programming of the test systems. This controller allows for custom testing, not only for single die but for wafer level testing. The software also allows for specific test parameters to be set and and to be monitored during the tests. The tool is equipped with sophisticated test diagnostics that allow engineers to quickly identify faults and provide detailed information on how it occurred. This includes positional information and measurements on the position of the probes and devices. Overall, TERADYNE J 750 provides a flexible, high-speed, high-throughput solution for testing multiple die and wafer-level integrated circuits and devices. With its fully automated design and comprehensive test diagnostics, the asset minimizes time and cost for test and debug, giving engineers a powerful test solution for the efficient testing of high-volume semiconductor devices.