Used TERADYNE J750 #9410495 for sale

TERADYNE J750 is a state-of-the-art automated test platform that is designed for advanced final test applications. It features an all-in-one, low-profile form factor that is suitable for environments that have limited space and need increased test coverage. TERADYNE J 750 features a single vector based tester, which provides the user with dynamic test applications that require circuitry beyond the ability of an In-Circuit Tester. The tester is capable of testing complex high-speed devices such as CPUs, ASICs, ASSP systems and Memory devices with parallel testing. The user can select from a wide range of test resources, including Analog, Mixed Signal/Digital and Embedded Core testing, as well as software and custom on-board programming. This allows for total test coverage and flexibility. J750 has a single core 80 MHz processor, which optimizes the testing process and makes accurate Signal-To-Noise testing possible. J 750 provides an integrated eight-site programmable test head that consists of four Digital I/O, four Analog I/O, four High current sources and two High resolution sources. This allows for multi-site programs and applications that test a variety of technologies. Programmable UUT voltage and current sense lines, which provide for self-diagnosis and fault diagnostics, are available on TERADYNE J750. Integrated with TERADYNE J 750 is a TERADYNE E-5900 Voltage Source Measurement Unit (VSMU) that works with the tester to provide out-of-system voltage transition testing. The E-5900 is capable of up to 24V supply voltages, delivering up to 500mA of current. J750 also offers a series of 2U high-density switching systems that allow users to connect to their test system quickly and easily. J 750 is connected to a host computer via Ethernet interface, and a suite of Windows-compatible tools are available for test design, execution, and data analysis. TERADYNE J750 also supports a variety of ATE software, allowing users to develop powerful, flexible and reliable test programs. Its advanced test program capabilities, along with its easy integration into existing systems, make it a great choice for high-speed, final test applications.