Used TERADYNE J971 #9094442 for sale

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Manufacturer
TERADYNE
Model
J971
ID: 9094442
Logic tester 100MHz, (256) I/O Channels (64) Channels with 256K vector matrix option (32) Timing edges 4M Vector memory Parametric measurement unit 225pS Edge placement accuracy (4) 5A High current V/I sources.
TERADYNE J971 is a high-speed, in-line Final Test System crafted for high-volume, complex consumer electronic device production environments. Designed to meet the requirements for high-density and high-precision testing, TERADYNE J 971 is a modular, software-driven system with integrated manufacturing compliance features. With its high-performance automatic handler and optimized test head configuration, J-971 enables a smaller test footprint and enhanced overall throughput. J971's integrated Paraglide Handler can accurately transport and test devices up to 50mm in size and 600 grams in weight at 0.4 milliseconds per move. Optical inspection and barcode reading capabilities ensure correct device placement in the test head, preventing mis-test operations. Its Smart Error Correction feature helps recover loss-of-worker time, ensuring constant production output. For test handling, TERADYNE J-971 supports a comprehensive list of test interfaces including, but not limited to, BGA, LGA, and CSP. To ensure accurate test results, the system owns Interference Error Correction (IEC) feature that maximize signal integrity and test accuracy by compensating for inadvertent signal interference. Also, J 971 has environmental functions to protect the device under test (DUT) and programmable mechanical advanced shock protection (ASP) to minimize rare mis-handling and mishandling which can lead to device program or damage. It also come with tight environmental controls to stabilize production environment, providing optimum test conditions. To reduce part variation impact, TERADYNE J971 has wafer trim, optimizing part accuracy and reliability. Also, traceability features like Improved FIT Rate (IFR) performs online data logging with continuous fault analysis to limit inflammation rates. These features when combined ensure consistent minimum part defect level.
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