Used TERADYNE J971SP #20697 for sale

TERADYNE J971SP
Manufacturer
TERADYNE
Model
J971SP
ID: 20697
Vintage: 1995
with 256 I/O pins, 1 Meg vector memory per pin, 60MHz Data rate (120MHz multiplexed data rate), +/- 500ps edge placement accuracy, MTO (memory test option), CTO (converter test option), WaveView option, 4 device power supplies with high current VS, Sun Ultra sparc 2 (or sparc 20 as host computer) 1995 vintage.
TERADYNE J971SP Final Test Equipment is a multi-site, parallel test system specifically designed to maximize throughput for fast-turnaround device test applications. It is a versatile platform suitable for a wide range of component testing, including automotive, RF and ASIC/SoC test applications. J971SP is designed to maximize production efficiency, providing high throughput at low cost-per-test with flexibility to accommodate different product types and sizes. This is accomplished by implementing a low-cost, gravity-sorted gang-style test bed and optimized hardware & software designs. The unit delivers up to 28 parallel test sites in a single bench-top package. Each site supports a variety of fast test connections of up to 1.6Ghz, including TLP (Test-reel Loaded Processor), low-capacitance fixtures, SOJ, QFP and uBGA connections. High-speed data transfer of up to 20Mb/s is supported by multiple simultaneous channels using advanced lane distribution technology. The machine features multiple controller designs, ranging from single resource box to expanded box designs, allowing for size and cost optimization. Several remote control station options are available to provide a variety of ways to manage and monitor test program execution. Multi-test modes are offered for improved memory and speed efficiency. The electrical tests for the uBGA and SOJ pins are based on MEMS6 technology, providing better channel discrimination with minimum channel crosstalk. TERADYNE J971SP provides easy integration with existing production processes. The support of standard communication protocols, including GPIB, allows easy connection to automatic handler and/or existing measurement equipment. In addition, J971SP offers advanced diagnostic capabilities including the exclusive SmartTest tool, which automatically generates test program and adapts tests to maximize through-put and reduce test time. Also included is Fault Finder, which inspects protected pins, digital thresholds, stuck-at-faults and crosstalk in a single scan. TERADYNE J971SP is an ideal solution for test applications requiring high throughput, low cost-per-test, and flexibility without sacrificing performance. Its advanced diagnostic capabilities, wide range of test fixture types, and easy integration into existing production processes make it the perfect choice for quickly and reliably testing a Variety of Components.
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