Used TERADYNE J973 #9176661 for sale

Manufacturer
TERADYNE
Model
J973
ID: 9176661
Wafer Size: 8"-12"
Vintage: 1998
Tester, 8"-12" Process application: Wafer sort Copper process Batch / Single wafer: 25" Features 512 Channels AP 512 Channels wide ADS fancut (200 MHz) (2) 50 A GVS 64M LVM 128 Channels of 256K VMO 200 MHz MTO (48) 128M SPO CE Marked 1998 vintage.
TERADYNE J973 is a highly advanced universal final test equipment designed to address the complexity and diversity of today's consumer electronics products. This widely respected system combines high-performance multiple test channels with leading edge data management features. The unit's up to 14-channel test architecture allows maximum test coverage and flexibility for a broad range of ICs and other components. It supports top and bottom electrical testing in some DIPs, LCCs, SOs, packages, and connectors. This advanced die-level test machine is designed to be used for useful device and tool burn-in and test. The reliable burn-in technique and quick test solution save time and cost. TERADYNE J-973 is an FPGA-based modular test asset that enables users to develop higher speed and more accurate tests. It features a digital signal processing (DSP) card that enhances the model with automated test pattern generation, linearity and accuracy tests, and more. The equipment also boasts a powerful software package which can be used to generate tests quickly, conduct accurate diagnostics, and make product development decisions faster. The powerful diagnostic tools included in the system allow for complex tests and detailed product fault analysis. It is further enhanced by advanced data storage and reporting features that enable users to collect and analyze complete test data from multiple runs. The package includes a remotely programmable test head, a wide variety of test fixtures, and a PC that provides a complete suite of software tools. The unit offers the ultimate in testing accuracy and reliability. The board-level test program provides a wide range of testing on different assembly levels, as well as on multiple tests at the component level. Its exclusive DC test capabilities can assess the performance of key components from the board to the component level. J 973 is an extremely capable test machine that can provide fast and accurate test results for various types of consumer electronics. Its highly flexible test architecture and powerful diagnostic tools make it an ideal choice for production and development environments. Its sophisticated data storage and reporting features make it ideal for complete test and fault analysis.
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