Used TERADYNE J973 #9177562 for sale

TERADYNE J973 is a state of the art final test equipment designed for a wide array of product testing and debug requirements. It offers several unique features such as multiple unique test capacities, an integrated handler, and high speed signal generation, all in one easy to use package. The system is capable of accommodating up to 48 user-defined test capacitors, which are designed to quickly and accurately measure specific electrical parameters in a range of devices such as unit-on-chip (SoC) systems, integrated circuits, microprocessors, and other components. The user-defined test parameters allow testing to be performed quickly and accurately on any number of devices in a limited space; perfect for high volume production applications. This machine also includes an internal debug terminal capable of performing quick, in-line device debugging as well as support for industry standard test access port (TAP) for debug access. The integrated handler module in TERADYNE J-973 is designed to automatically feed and test devices on a continuous basis, reducing the overall testing time. The integrated handler module is also designed for use with a variety of industry standard handler arms as well as any specialized component handlers required for testing. The handler module also allows for easy integration with test equipment and other automation systems, enabling the entire test process to be automated. Additionally, J 973 also incorporates advanced measurement technologies such as high speed signal generation that can simulate and capture real-time signals over the entire operating range. With high speed signal generation, users are able to determine the margins of passing and failing tests without the need for standard test vectors. This speeds up the testing process and allows the tool to identify and debug hundreds of devices in near real-time. In total, J973 provides an easy to use testing asset that is highly customizable, allowing for testing of almost any device in a limited space, as well as advanced functionality such as automated handler operations and high speed signal generation. The model is suitable for use in production testing operations as well as failure debug operations.