Used TERADYNE J973ST #293610194 for sale

TERADYNE J973 is a final test equipment that is designed for testing semiconductor devices and interconnects. The system is designed for testing devices up to 1.5GHz in speed and can perform multiple tests such as high voltage AC or DC, leakage, and AC response current. The unit also offers high-speed pattern generation and analysis capabilities and high-speed ATE technology. It comes with the latest parallel testing tools and an array of connectors and test adapters. The unit includes extensive programmable modules that can be used with internal RAM and non-volatile memory for data storage. These modules provide test sequencing, power-on and power-off sequences, and various safety outage sequences for over-current and over-voltage. The J973 is capable of monitoring numerous parameters such as forward and reverse voltages, currents, and power. The module also features ad-hoc test designs that allow users to modify the test design based on the component or product to be tested. The entire machine is control through a user-friendly graphical user interface that displays detailed information such as test time and cycle, and test results. The tool also allows a signal synchronizer device to be integrated into the unit to ensure that signals are received in the correct format. Additionally, the asset features a local or remote PC-based controller that allows users to perform tests and analyze test results. The J973 has a wide range of electrical and software strategies for various parameters, allowing for a high level of flexibility and customization. The model also offers numerous testing routines such as automated suite test evaluation, thermal tests, and component-level diagnostics. It has a thermal management equipment to ensure that the test results do not reflect influences from the test environment. Overall, TERADYNE J973 ST is an advanced final test system that provides high accuracy test results along with comprehensive test sequencing and performance analysis tools. It allows users to conduct tests on devices up to 1.5 GHz while providing an intuitive interface that allows users to control the testing process and view results quickly and accurately.