Used TERADYNE TS128 #9194361 for sale

Manufacturer
TERADYNE
Model
TS128
ID: 9194361
Vintage: 2007
ICT Tester Sys control (13) Pincards PIO Card AFTM Card ICA Card DUT Power 7 2007 vintage.
TERADYNE TS128 Final Test Equipment provides advanced semiconductor test and burn-in capabilities in a high-speed, low-cost platform. This high-quality tester is designed to increase overall test throughput and reduce test costs. It features a robust architecture, enhanced control capabilities, and powerful diagnostic tools. The system is capable of testing both logic and discrete mixed signal devices. It features a deep memory architecture that allows it to simultaneously store test conditions for different devices, while still providing high throughput. Additionally, it has a high-speed address generator that can generate test sequences with multiple addresses and patterns at speeds of up to 10 MHz. The unit integrates multiple hardware and software platforms, providing a comprehensive test machine solution. In order to maximize test throughput, TERADYNE TS 128 utilizes a powerful vector architecture. This architecture enables the tool to accurately capture the characteristics of each device under test, allowing for more precise test results. The asset also employs an advanced control structure that allows for more control on a device by device basis. This structure increases the overall accuracy and efficiency of the test process. The model also has built-in capability to detect open, short, or cross-condition faults. In addition, it can perform low frequency testing and calibration functions. Additionally, it has a full suite of diagnostic tools that allow users to quickly identify and troubleshoot problems. This suite includes an Error Logbook, which is used to track errors during the testing process, and a schematic viewer to assist with troubleshooting. TS128 Final Test Equipment is designed to provide an efficient and cost-effective solution for the rapid testing and burn-in of complex mixed-signal devices. Its deep memory architecture, advanced control capabilities, and powerful diagnostic tools allow it to quickly collect accurate device information. This system is ideal for companies looking for a reliable and affordable solution for their semiconductor testing needs.
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