Used TERADYNE UltraFlex HD #293658907 for sale

TERADYNE UltraFlex HD is a high-speed, high-precision and high-durability final test equipment. It is designed for use in advanced wafer probing, integrated circuit test, and system-level test applications. Its feature set includes a sophisticated test and probe platform, automated test sequencing, high-speed interconnects, and high-performance data capture. The unit is capable of testing ICs in a variety of sizes and package types in a wide range of temperatures, voltages, and frequencies. TERADYNE ULTRAFLEX-HD features a high-bandwidth, high-loading, parallel probe machine which enables high-precision test measurements. The parallel probe array includes pin-contact coverage of all package leads, allowing accurate test measurements with minimal disturbance to the cathodic layer. The tool is also equipped with a linear motion servo motor that can rapidly adjust probe position during test and probe measurements. This feature is particularly useful for testing high-density packages that require precise alignment between pins and test probes. ULTRA FLEX HD test and probe platform uses a distributed switch matrix architecture to route signals between testers and devices under test. This architecture allows for the automation of test sequencing and data acquisition. It also offers a high degree of configurability, enabling the asset to be easily customized to meet specific production needs. ULTRAFLEX-HD model features a variety of interconnects and signal routing to facilitate high-speed transmissions. It supports up to 8 channels of differential signal transmission, up to 16 channels of single-ended signal transmission, and up to 18 channels of 14-bit single-ended signal transmission. Each of these transmission channels is managed by an on-board digital signal processor that encircles the signals to reduce noise and improve signal integrity. In addition, TERADYNE ULTRA FLEX HD equipment includes dedicated on-board data capture hardware that is optimized for processing large amounts of data in a short amount of time. It can monitor the state of all I/O pins and analyze interconnect waveforms with greater accuracy and faster data throughput than traditional analog data capture solutions. UltraFlex HD system also supports a wide range of data acquisition software to allow for automated data collection and analysis. Overall, TERADYNE UltraFlex HD is a powerful final test unit that is suitable for a wide range of production testing requirements. Its feature set includes high-bandwidth, high-precision andhigh-durability probe systems, a powerful test and probe platform, automated test sequencing, high-speed interconnects, and high-performance data capture. This machine is ideal for advanced wafer probing, IC test, and tool-level test applications.