Used TERADYNE UltraFlex HD #9160670 for sale

TERADYNE UltraFlex HD
Manufacturer
TERADYNE
Model
UltraFlex HD
ID: 9160670
Vintage: 2006
Tester (12) Slots Docked to UF200 by hinge 2006 vintage.
TERADYNE UltraFlex HD is a next-generation final test equipment designed to simplify the test process for high-volume semiconductor devices. The system offers superior flexibility and throughput in a robust hardware platform for a wide variety of applications. TERADYNE ULTRAFLEX-HD features a powerful, scalable hardware architecture that enables the consistent delivery of performance for production-grade testing needs. Its modular design allows up to 6 test channels in single-wide configuration and up to 24 channels in multi-wide configuration. This flexibility allows for a wide range of device sizes and types to be tested with the same unit. In addition, the architecture is also expandable to meet increasing testing needs. ULTRA FLEX HD features high-bandwidth signal management capability with 20 Watts of base power and up to 120 Watts of processing power. This power enables the machine to test a wide range of complex devices with the same platform. In addition, the tool delivers low-size and low-power consumption for a more energy efficient solution compared to other available test systems. ULTRAFLEX-HD also delivers optimized test times and cost-effective resourcing. It features an intuitive user interface which streamlines test programming and design verification. The asset also supports real-time and predictive diagnostics for fast and accurate fault detection in integrated circuits. The model is also designed to be interconnected with other production test systems, increasing its flexibility and production efficiencies. TERADYNE ULTRA FLEX HD also comes with an advanced analysis suite which helps improve the fault coverage and reduces the need for manual review. This analysis suite can generate comprehensive reports and also allows for graphical representation of test results. Overall, UltraFlex HD is an advanced test equipment that provides a cost-effective, energy-efficient solution to meet the needs of high-volume semiconductor device production. Its scalable hardware architecture and real-time analysis capabilities make it an ideal solution for final test requirements.
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