Used TERADYNE UltraFlex HD #9160784 for sale

Manufacturer
TERADYNE
Model
UltraFlex HD
ID: 9160784
Vintage: 2008
SOC Test system Qty Part number Description (1) 810-712-00 UltraFlex HD (12slots) (1) 600-485-00 UltraPin 800 (1) IN-267-00 HSD800-128 DSSC LIC (1) IN-261-02 HSD800-128 200MBS Data rate LIC (1) IN-262-01 HSD800-128 16M Pattern depth (1) 979-331-22 HSD1000 (1) IN-124-80 DSSC (1) IN-316-00 16M Pattern depth (1) IN-141-10 1000 Mbps Speed (1) 979-390-00 DCIO (1) 979-217-30 DC30 (1) 979-495-00 HDVS (24) IN-403-00 HDVS Channels (1) 810-982-00 VHFAC (1) IN-160-15 VHFAC Source High speed (1) IN-161-15 VHFAC Capture High speed (1) 814-641-00 Ultrawave 12G (1) 814-643-00 Ultrawave 12G MW Synthesizer LO (1) 814-644-00 Ultrawave 12G MW Synthesizer DR (1) IN-251-04 Ultrawave 12G. On-board dual AWG (1) IN-251-05 Ultrawave, Low Phase Noise dut ref (1) IN-250-02 Ultrawave 12G, 16 Universal RF ports (1) IN-250-03 Ultrawave 12G, 2nd Receiver License (1) IN-250-06 Ultrawave 12G, Noise source (1) IN-250-07 Ultrawave 12G, 1-port VNA (1) 814-650-00 Ultrawave 12G Splitter assembly (SC) (1) IN-911-00 Wireless modulation TLKT (1) 814-602-01 XW8400 System computer ultraflex (1) 979-223-10 12SLT Dual processor DSP (1) 810-523-00 32 Bit Parallel port interface (1) 979-528-20 Integ Kit. ultraflex MC. STND MANIP. MP4 XP (1) 810-127-00 MW / RF probe kit, 24" Hole, TGR (1) 810-137-20 I/F HNG All 12" WFR OPN BL (1) 810- 115-06 Kit, signal TWR 900 Pin IAS TGR / FLEX (1) 810-150-10 Probe card debug tool (1) 819-086-00 Ultraflex 12 engineering cart Test Head Slot Part number Name 2 805-041-00 UltraWave measure board 6 974-390-02 DCIO Board 10 805-044-00 Ultrawave synth ref board 12 805-014-00 VHFAC Board 14 974-242-10 HSD-I Board 16 974-331-44 HSD-M Board 18 974-217-30 DC30 Board 20 974-232-00 HDVS Board 22 805-043-00 Ultrawave synth Lo board 24 974-221-03 Support board 24 956-364-00 XGEM Board (On Support Board) Cabinet: 361-942-04 DSP Computer No missing parts 2008 vintage.
TERADYNE UltraFlex HD is a final test equipment designed to optimize performance, reduce cost and enable higher reliability in automated test environments. With its advanced Flash DTS (Dynamic Test Selection) capability, it helps to ensure test coverage with fewer pins and test channels. TERADYNE ULTRAFLEX-HD uses a high-performance, Universal Execution Platform (UEP) that provides high throughput and flexibility. This system supports up to two million tests per day and has a maximum capacity of 336 test sites. This unit offers advanced test analysis and reporting capabilities to minimize downtime. ULTRA FLEX HD has a variety of features that enable it to provide higher levels of accuracy and reliability. These features include a high-resolution sample rate - up to 8 GS/s per site, low latency, flash data capture of up to 600 Mb/s per site, wide dynamic range and a reliable and fault resilient design. ULTRAFLEX-HD is also equipped with a software suite that includes comprehensive test development tools for various protocols and applications. This software also supports Fault Detection, Redundancy Control and Simulation, among other features. The machine also offers automated test validation processes and provides customizable test strategy for the user's requirements. The tool operates over a variety of operating systems such as Windows, Linux and VxWorks. Additionally, it also supports multiple test interfaces such as In-Circuit, Boundary Scan, Functional, JTAG and IP-Based test interfaces. TERADYNE ULTRA FLEX HD's capabilities can be further augmented with various diagnostic tools and options. These include Automatic Test Pattern Generation (ATPG) tools, Electromagnetic Interference (EMI) mitigation tools, Asset Data Regression Test (SDRT) and Reliability Analysis. These tools can be used in conjunction with UltraFlex HD to ensure the highest reliability of the device under test. With its power breakthrough capabilities and cutting-edge features, TERADYNE UltraFlex HD provides users with a high-performance and dependable final test model. This equipment allows users to reduce the cost and downtime associated with production test systems while ensuring maximum reliability of the final product.
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