Used TERADYNE UltraFlex SC #293649587 for sale

TERADYNE UltraFlex SC is a high speed, high throughput final test equipment for testing semiconductor devices. Designed to fit in tight spaces, TERADYNE ULTRAFLEX-SC provides unmatched testing capabilities in a compact form factor. The system utilizes advanced tools to reduce test times and increase yield while providing the highest quality test data. ULTRA FLEX SC is based on a modular unit architecture, allowing users to configure their machine to best fit their specific needs. Each tool is equipped with a multi-channel test handler, test head and Digital Element Processor (DEP) platform. The test head acts as the link between the load board and the DEP platform, enabling it to deliver testing at high speeds. In addition to the hardware, TERADYNE ULTRA FLEX SC also integrates a broad portfolio of software testing solutions. The asset includes Open Model Test (OST) software, which provides an easy-to-use platform for developing and running test programs. UltraFlex SC also supports additional modules from the OST suite, such as Diagnostics, Pressure Management, and Quality Analysis. The equipment's Digital Element Processor platform provides high speed capabilities, allowing for simultaneous testing of up to 4 devices at a time. The DEP also provides a wide range of Test List stimulation capabilities, tailored to achieve optimal results with products from a wide range of suppliers. This versatile platform also supports a variety of analog and RF devices. ULTRAFLEX-SC integrates with a range of other systems, including panel testing, back-end process equipment, and supply chain systems. And it is engineered to be easy to maintain and upgrade. The system features on-screen alarms, detailed error monitoring, and automated error resolution capabilities. In summary, TERADYNE UltraFlex SC is a robust, high-performance final test unit. The machine's modular architecture, high speed performance, and broad range of software and hardware solutions make it the ideal choice for any semiconductor test requirement.