Used TERADYNE UltraFlex #9128978 for sale
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ID: 9128978
Vintage: 2011
Testers,
SC 24 slot frame
(10) HSD1600 Instruments
256 digital channels per instrument (2560 pins)
100 ps accuracy
200 Mbps data rate
Diferential capability
Scan enabled
Digital signal source and capture enabled
512 LVM per pins
8 core DSP enabled
Protocal Aware functionality
Tests nWire and DDR protocols system wide
(1) UVI80 Instrument
(80) CH
AC waveform source and measure capability
Tests D/A and A/D converters embedded in complex SOC or microcontroller devices
(2) UVS256 Instruments
(256) CH per instrument
HEXVS and VSM Ultra High Accuracy and Stability Processor Core Supplies
Performs at lower voltages
(4) HexVS Instruments
(6) CH per instrument
2011 vintage
TERADYNE UltraFlex is a Final Test Equipment designed for use in automated wafer testing applications. The system is designed to offer maximum flexibility and cost-effectiveness in the testing process. It can be used for a wide range of testing scenarios, including probing, parametric, high voltage and mixed-signal testing scenarios. The ultra-high-speed operation of the unit is enabled by a combination of real-time processor-controlled Tester Core and Industry-leading automation components. This ensures that the highest throughput rates are possible with TERADYNE ULTRA FLEX machine, while at the same time ensuring highest yield throughout the testing process. The architecture of UltraFlex is based on a distributed tester model. Multiple ULTRA FLEX Testers, connected via communication and control buses, are used to run tests on multiple probers simultaneously. The tool architecture ensures maximum scalability, as an increasing number of tester cores can be connected and used without any additional hardware modifications. TERADYNE UltraFlex asset also features advanced scheduling and optimization tools, which enable users to create and maintain optimal test programs. Users can easily adjust testing parameters and re-schedule tests to achieve maximum throughput in the testing process. Additionally, TERADYNE ULTRA FLEX model is designed with a low maintenance cost and reliable operation in mind. The equipment allows users to monitor, diagnose and fine-tune tests directly from their respective PCs via remote access. The system comes with a range of built-in diagnostic tools that allow users to quickly identify and fix problems arising from probe contact, thermals, and power supply. UltraFlex unit is designed for optimal test results and high-throughput performance. It is the ideal automated test machine for high-volume and low-cost semiconductor testing applications. The tool features a flexible and cost-effective architecture and can be easily used by vendors, customers and test engineers alike.
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