Used TERADYNE UltraFlex #9379707 for sale

TERADYNE UltraFlex Final Test Equipment is an advanced piece of automated test equipment (ATE) designed for high-volume semiconductor companies. It enables generation of reliable test data quickly and effectively, guaranteeing optimal product performance and quality assurance. TERADYNE ULTRA FLEX is made up of three main elements: the test head, prober and handler, and analysis system. The test head contains a PC housed in a durable, dustproof casing and features a range of testing capabilities, including specialized physical tests, high-speed digital tests and SMART software-based test programs. For prober and handler capabilities, it includes an inbuilt probe assembly, a vision unit integrated with AutoFocus technology, and an MOSFET kit enabling accurate semiconductor performance analyses. Meanwhile, the analysis machine collects and processes the data generated during testing, providing multiple views to help users quickly and accurately identify potentially defective semiconductors. UltraFlex is also designed with flexible test architecture, allowing it to be used with multiple different test platforms. This means that users have the option to customize the tool to their own requirements, such as adding additional test components or scaling the asset to larger unit volumes. Furthermore, it is equipped with multiple advanced features to ensure the highest quality testing. These features include multi-site calibration capability which ensures accurate measurements, signal integrity measurements that correct signal integrity differences between sites, and stable environment technology which maintains the optimal temperature and vibration levels for accurate testing results. Overall, ULTRA FLEX Final Test Model is a powerful ATE solution for high-volume semiconductor production. It enables rapid generation of reliable test data, helping to guarantee consistent product performance and quality assurance. Through its advanced features, flexible test architecture and multiple inbuilt testing components, it can provide users with increased efficiency and insight into the semiconductor production process for improved results and bottom line.