Used TERADYNE Z 1880 #293818770 for sale

TERADYNE Z 1880
Manufacturer
TERADYNE
Model
Z 1880
ID: 293818770
Test system.
TERADYNE Z 1880 is an advanced final test equipment for a variety of high-density, high- speed applications. It is a best-in-class manufacturing classification for testing Electronic Control Units (ECUs), semiconductor wafer chipsets, MEMS, and imaging sensors. It offers the highest simultaneous test density in its class and a wide range of specialty module options, such as temperature control and buck/boost voltage settings. With its versatile architecture, it can also be configured for specific requirements and large production runs. TERADYNE Z1880 is compatible with various industry-standard probers and utilizes a modular design to accommodate a variety of test parameters. The mainframe is composed of tightly integrated test head and interface electronics that are ready-to-use, highly scaleable, and easy to maintain. The system is capable of testing up to 32 devices in parallel at speeds up to 7.5MHz, with support for up to 128 total devices. The various test parameters can be configured to optimize the testing process for either maximum throughput or highest test precision. Z 1880 offers several comprehensive probe equipped options and feature rich capabilities, such as Open Grid Architecture (OGA). This allows the unit to configure test structures across multiple test heads and parse the individual signals into virtual tester channels. It also provides high-speed sorting, which can be used to quickly detect and reject faulty devices. The machine also supports multi-level matrix testing for extended temperature and supply range, allowing it to detect very low failure rates within a product. Other features of Z1880 include data logging, device characterization, wafer level testing, digital imaging, and 3D visual probe positioning. It is controlled by TERADYNE software suite and can be used with a variety of software languages, such as LabVIEW, Visual Basic, and C++. TERADYNE Z 1880 is an exceptional choice for testing of a variety of high-speed high-density applications. Its versatility, scalability, and feature richness make it a great choice for manufacturing operations that are seeking a cost-effective yet reliable and powerful testing solution.
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