Used TERADYNE Z 1890 #293649037 for sale

TERADYNE Z 1890 Final Test Equipment is an automated system for in-line testing of electronic and optoelectronic products. The unit can be configured either as single stage or Dual Stage and has been designed to enable the testing of high volume, complex assemblies. The machine consists of a Foundation Platform with an Advanced Platform Module. The Foundation Platform includes an embedded Ethernet port, one or two standard Smart Testers, and a discrete detector. The Smart Testers are used to make measurements and provide feedback on the product being tested. They can also measure voltages, currents, and optical measurements. The discrete detectors can detect the presence of a discrete pin or component on the PCB. The Advanced Platform Module consists of the following components: High Pressure Porosimeter, AOI (Automated Optical Inspection), Digital Image Analyzer Module (DIAM) and CAD Modeler. The High Pressure Porosimeter measures the fill level of a package, as well as its material properties. The AOI uses multiple image-based techniques such as X-ray, visible light, and infra-red imaging to inspect PCBAs (Printed Circuit Board Assembly) for defects such as shorts, opens, and insufficient solder joints. The DIAM provides an automated way of verifying components and checks their placement. The CAD Modeler allows 3D inspection of structural mount heights and the verification of voids in soldered components. TERADYNE Z1890 also includes software packages for ECO (Engineering Change Order) control and traceability. It supports the use of barcode readers for the identification of terminal blocks and components, both for testing and traceability purposes. The tool also supports various peripheral devices, such as multiple optical placement verification systems, robotic pick and place systems, vision systems and fault localizing systems that are helpful in reducing operational costs. Overall, Z 1890 Final Test Asset provides a highly-adaptable, low-cost testing platform that can quickly assess the performance of electronic and optoelectronic components. It offers enhanced detection capabilities and is especially useful for examining components in sub-visible spaces. Not only is this model reliable and robust, but it can also help increase the throughput of electronic product testing.