Used TESEC 7819 HB #9211913 for sale

Manufacturer
TESEC
Model
7819 HB
ID: 9211913
Tester Used for TESEC 881.
TESEC 7819 HB is an advanced test equipment designed for high-precision automated testing of boards, chips, and assemblies. The system is ideal for the modern laboratory where large numbers of tests must be performed quickly and accurately with minimal user intervention. 7819 HB unit is a modular platform, allowing a wide range of configurations to fit different testing requirements. It is composed of a base unit and multiple test modules. Each test module can be tailored to measure certain characteristics and parameters in satisfaction of specific requirements. The base unit of TESEC 7819 HB provides power and other communications and control services to the machine. It also allows for daisy-chaining multiple test modules for simultaneous testing missions and the collection of test data from all the modules. In addition, the base unit includes advanced control features from various platforms such as Windows or Linux. Each test module of 7819 HB has its own microprocessor and microcontroller for performing specific tests. These test modules are equipped with multiple probes, sockets and clips to facilitate the connection of a wide range of components under test. In addition, the modules feature a wide range of communication and control interfaces to connect the test tool to different test programs and databases. TESEC 7819 HB asset has numerous features that make it suitable for high-precision tests. It enables accurate measurements of each component's power performance, energy consumption, and operational parameters. The model also offers built-in test suites for equipment diagnostics and fault detection. It also provides programmable test sequences to make sure that all tests are performed in specific orders and levels suitable for the highest precision results. 7819 HB offers a complete suite of capabilities for a comprehensive test experience. Its advanced features make it suitable for conclusive analysis of board, chip, and system performance and reliability. Furthermore, its high-precision results help reduce the cost of test and improve time-to-market for new products.
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