Used TESEC 881-TT/A #9232844 for sale

TESEC 881-TT/A Final Test Equipment is an automated integrated testing system that can help drastically reduce time and effort spent on in-circuit and functional tests for semiconductor devices. It allows for efficient and effective test coverage and automated results collection of all components of a semiconductor device. This unit offers a high throughput of testing for improved product quality. Features of TESEC 881-TT/A Final Test Machine include a microprocessor-controlled testing platform, as well as software-controlled signal conditioning, probe tip selection, and measurement selections for all components of the device. The tool is capable of testing multiple devices in parallel, allowing for quick and reliable testing of multiple devices simultaneously. The asset also offers an enhanced visual interface for easy operation and easy integration of additional model capabilities. This equipment also offers a range of test capabilities for both in-circuit and functional testing. It is capable of performing power-on, power-off, DC, AC, pulse, and RF testing, allowing it to develop a comprehensive testing profile of any device. It is also able to measure parameters such as leakage, capacitance, inductance, temperature, and gain. This system also features an integrated tag and label application for quick and accurate testing. It includes a range of sensors that allow it to accurately measure and analyze device performance and properties. It is also capable of generating a range of test reports, along with automatic analysis to help ensure valid results. Additionally, it offers redundant power circuit protection and a built-in cooling unit to reduce the risk of overheating devices. Furthermore, the machine offers a friendly user interface and features to help users efficiently and accurately complete testing and analysis. Overall, TESEC 881-TT/A Final Test Tool is a comprehensive, automated test asset designed to help reduce the time and effort required for in-circuit and functional testing of semiconductor devices. It offers a range of test capabilities to cover all components of a device, as well as automated results collection and an enhanced visual interface for easy operation. Additionally, it features redundant power circuit protection and a built-in cooling model to minimize the risk of overheating while ensuring valid results.