Used THERMONICS T 2500EA #9236865 for sale
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ID: 9236865
Wafer Size: 12"
Vintage: 2011
Temperature forcing system, 12"
2011 vintage.
THERMONICS T 2500EA Final Test Equipment is a comprehensive system designed for fast and accurate testing of semiconductor device performance. It combines automated testing, thermal analysis, and data acquisition capabilities in a single, integrated unit. T 2500EA provides accurate temperature and current measurement, and comprehensive reporting of the device's performance and status. The machine is designed for easy setup and operation, providing a control interface to allow the user to program their tests, and providing real-time data visualizations and diagnostics. The tool offers high-accuracy (0.02°C), high-temperature (200°C max) and high-stability (±0.01°C) performance over its operating range. The asset also provides adjustable fan speed control via a temperature dependent control loop and adjustable sensitivity to PWM signals for uniform test stability. THERMONICS T 2500EA provides real time visualization of temperature profile, with two-dimensional heat maps which allow for the plotting of measured temperatures and corresponding time periods. This feature also includes a graphical temperature display with a digital input/output range of up to 1600°C. This allows users to monitor temperature results and adjust parameters as desired. The model also provides a variety of reporting features to record results and generate detailed reports of the device's performance. The reporting capabilities include a log of the performance and response of the device over its specified temperature range, exportable as a text or CSV file, and data analysis for analyzing the device's performance over time. T 2500EA supports a variety of communication interfaces including USB 2.0 and Ethernet, allowing the user to access the equipment into a network. Additionally, the system can also provide remote access and control via an optional, built-in web interface. THERMONICS T 2500EA Final Test Unit provides a comprehensive, easy-to-use solution for testing semiconductor devices. Its wide range of features and reporting capabilities provide the user with an efficient, accurate, and reliable means of evaluating the performance of the device.
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