Used W&G PFA-35 #9129867 for sale

W&G PFA-35 Final Test Equipment is a compact, precision automated ATE used to final test complex multi-chip units (MCUs) with up to 10 pins. It features an easy to use interface, making it the perfect solution for high volume production facilities. PFA-35 was designed with field proven technologies, ensuring reliable operation and accurate results for every test conducted. The system allows for versatility with its flexible software tools, providing users with the ability to customize the platform for more complex applications. As with all W&G instruments, W&G PFA-35 undergoes rigorous testing before leaving the factory to ensure high quality performance and accuracy. The unit is high speed, able to test an MCU in as little as 5 seconds with up to 10 pins in parallel. It also features a smart test stage that can store up to 1 million test conditions in its on-board memory, and a vector test method that allows for a maximum of 4 million cycles per hour. The machine is highly efficient, with an automated built-in instrument calibration process and a built-in self-diagnostic tool that keep test times to a minimum and accuracy to its peak. PFA-35 is the perfect solution for automated production line testing, offering up to 6 test sites that can be readily added to any existing test asset. The model is expandable up to 237 test sites and the equipment fan cooling system ensures each individual site is well ventilated during the testing process. W&G PFA-35 features safety measures that reduce risks of harm to personnel, equipment, and testing supplies. In addition, a relatively low-power consumption contributes to the unit's sustainability and cost savings. Its portability allows it to be used in any environment with no additional electricity requirements. Overall, PFA-35 1 Final Test Machine is a reliable, highly-accurate tool for testing complex MCUs. Its fast speed, expandability, and safety features make it an ideal choice for high volume production facilities looking to increase their testing accuracy and throughput.