Used WANFUDA WFD1705 / 1805 #293659211 for sale

WANFUDA WFD1705 / 1805 Final Test Equipment is an advanced non-volatile memory testing tool designed to ensure quality and reliability for large NAND products in a variety of applications. The WFD1705 and WFD1805 are both third-generation testing systems, featuring the latest industry-standard testing technology, including 3D cell mapping, flash programming, readback, write/read operations, background-comparison, and flash verification. WFD1705 / 1805 systems provide both pre- and post-test data analysis functions, as well as flash layout and production tests. The WFD1705 system has a complete 3D NAND cell-level mapping function, with enhanced mapping accuracy and features the latest up-to-date triple layer cell mapping technology. This feature allows developers to quickly and accurately detect and isolate any potential manufacturing defects and weak points on the memory chip, enabling the correction of any problems prior to product shipment. The WFD1705 unit features a Flexible Flash Process Operation (3FO) capability, which allows multiple concurrent reading and writing operations to occur simultaneously with a single command. This provides faster testing time, while also eliminating multiple manual commands, thereby increasing efficiency. With the 3FO function, both read/write commands will begin simultaneously, and can be executed separately. The WFD1705 machine also features power-on programming and write/read operations. This enables production of pre-programmed data into multiple NAND chips at once, with all operations operated manually. This function drastically cuts down on programming time, enabling faster production output. The WFD1805 tool is an improved and upgraded version, which is designed to provide users with an improved asset performance. Notable enhancements include increased flash verification speed, enhanced feature support, increased efficiency in testing, and added user-defined parameters and features. This model also includes both pre- and post-level cell testing and verification, meaning that users can compare a variety of layouts for both the new and previously-made NAND chips prior to production. Overall, WANFUDA WFD1705 / 1805 Final Test Equipment is an advanced and reliable tool for ensuring the data integrity of memory chips used in a variety of devices. With its advanced 3D NAND cell-level mapping technology and flexible performance options, manufacturers can quickly and accurately detect any potential errors in the memory chips and correct them. Furthermore, the system also allows for faster production output due to its power-on programming and write/read operations. With its reliable performance and advanced features, WFD1705 / 1805 Final Test Unit is a perfect solution for manufacturers looking to ensure the highest level of quality and reliability for their products.