Used YOKOGAWA AL 9740 #9186094 for sale

YOKOGAWA AL 9740 Final Test Equipment is a full-featured, powerful, and versatile testing system designed for both product burn-in and functional testing. It is capable of testing a wide range of semiconductor devices including ICs, ASICs, MCUs, and RFICs. It is an automated unit designed to offer operation and monitoring capabilities for both burn-in and functional testing in a single instrument. AL 9740 offers several features and capabilities to meet the demands of a wide variety of applications. The machine operates at a maximum power of 600V with a maximum current of 1A. It is equipped with three programmable power supplies, sixteen general-purpose programmable I/O lines, and an optional four-channel high-speed logic analyzer with a maximum sample rate of 20 MHz. This allows for comprehensive testing of features such as power-on reset and soft power cycling. The tool also offers a number of fail-safe features that ensure the maximum safety and reliability of the test process. These features include over-voltage and over-current protection, automatic shut-off if no valid test parameters are supplied, and an over-temperature alarm. Additionally, the asset includes an in-built self-diagnostic to detect any potential errors or faults, providing peace of mind for users. YOKOGAWA AL 9740 is designed to be easy to use, with a user-friendly control panel that offers operatives clear feedback on test conditions and results. The model allows for easy integration into existing laboratory and industrial test equipment by using a modular design that includes standard external communication interfaces such as Ethernet/RS-232/RS-485. Connecting the equipment to computers is also possible, allowing for access to large databases and complex test environments. In conclusion, AL 9740 is a comprehensive, automated testing system with maximum safety and reliability features. It offers numerous advantages over traditional test equipment, making it a great choice for a variety of testing applications. It is an ideal solution for burn-in and functional testing of a wide range of semiconductor devices.