Used YOKOGAWA ST 6730 #9034561 for sale
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ID: 9034561
Tester
Configuration:
S1(eng)> dm inst
[ Installed modules display ]
pin map | 1 2 3 4 5 6
|1234567890123456 7890123456789012 3456789012345678 9012345678901234
[NSIO]--------------------------------------------------------------------------
1- 64|1111111111111111 1111111111111111 1111111111111111 1111111111111111
65- 128|1111111111111111 1111111111111111 ................ ................
129- 192|1111111111111111 1111111111111111 1111111111111111 1111111111111111
193- 256|1111111111111111 1111111111111111 ................ ................
[HSIO]--------------------------------------------------------------------------
257- 304|1111111111111111 1111111111111111 ................
pin map | 1 2 3 4 5 6
|1234567890123456 7890123456789012 3456789012345678 9012345678901234
[DIHD]--------------------------------------------------------------------------
513- 576|1111111111111111 1111111111111111 1111111111111111 1111111111111111
577- 640|1111111111111111 1111111111111111 1111111111111111 1111111111111111
Continue? (y/n)S1 Any Keyin>
LCDPIN | 1 2 3 4
map |123456789012 345678901234 567890123456 789012345678
-------------------------------------------------------------
1001-1048|111111111111 111111111111 111111111111 111111111111
1049-1096|111111111111 111111111111 111111111111 111111111111
1097-1144|111111111111 111111111111 111111111111 111111111111
1145-1192|111111111111 111111111111 111111111111 111111111111
1193-1240|111111111111 111111111111 111111111111 111111111111
1241-1288|111111111111 111111111111 111111111111 111111111111
1289-1336|111111111111 111111111111 111111111111 111111111111
1337-1384|111111111111 111111111111 111111111111 111111111111
1385-1432|111111111111 111111111111 111111111111 111111111111
1433-1480|111111111111 111111111111 111111111111 111111111111
1481-1528|111111111111 111111111111 111111111111 111111111111
1529-1576|111111111111 111111111111 111111111111 111111111111
1577-1624|111111111111 111111111111 111111111111 111111111111
1625-1672|111111111111 111111111111 111111111111 111111111111
1673-1720|111111111111 111111111111 111111111111 111111111111
1721-1768|111111111111 111111111111 111111111111 111111111111
1769-1816|111111111111 111111111111 111111111111 111111111111
1817-1864|111111111111 111111111111 111111111111 111111111111
1865-1912|111111111111 111111111111 111111111111 111111111111
1913-1960|111111111111 111111111111 111111111111 111111111111
1961-2008|111111111111 111111111111 111111111111 111111111111
2009-2056|111111111111 111111111111 111111111111 111111111111
2057-2104|111111111111 111111111111 111111111111 111111111111
2105-2152|111111111111 111111111111 111111111111 111111111111
2153-2200|111111111111 111111111111 111111111111 111111111111
2201-2248|............ ............ ............ ............
2249-2296|............ ............ ............ ............
2297-2344|............ ............ ............ ............
Continue? (y/n)S1 Any Keyin>
| 1 2 3 4
|CH 123456789012 345678901234 567890123456 789012345678
------------+--------------------------------------------------------
PMU |20 111111..1111 11..11111111
LCDPMU 1-48|96 111111111111 111111111111 111111111111 111111111111
49-96| 111111111111 111111111111 111111111111 111111111111
RVI 1-48|48 111111111111 111111111111 111111111111 111111111111
49-72| ............ ............
UVI | 8 11111111
CBIT |32 111111111111 111111111111 11111111
UVI map|12345678
-------+--------
map |11111111
fail |........
HDOT :1 XYCD :. GPIB :1 OT :.
RBIT :.
Continue? (y/n)S1 Any Keyin>
| imple id rev memorytype memsize/bank bank softrev fail/.
------------+-------------------------------------------------------------------
NSIO 1 | 1 6 4 256M 67108864words 1 0 .
NSIO 2 | 1 6 4 256M 67108864words 1 0 .
NSIO 3 | 1 6 4 256M 67108864words 1 0 .
NSIO 4 | 1 6 4 256M 67108864words 1 0 .
NSIO 5 | 1 6 4 256M 67108864words 1 0 .
NSIO 6 | 1 6 4 256M 67108864words 1 0 .
NSIO 7 | .
NSIO 8 | .
HSIO 1 | 1 1 0 128M 16777216words 1 0 .
HSIO 2 | 1 1 0 128M 16777216words 1 0 .
HSIO 3 | .
DIHD 1 | 1 1 4 . . . 0 .
DIHD 2 | 1 1 4 . . . 0 .
Continue? (y/n)S1 Any Keyin>
| imple id rev memorytype memsize/bank bank softrev fail/.
------------+-------------------------------------------------------------------
LLCD 1 | 1 4 0 256M 2097152words 1 5 .
LLCD 2 | 1 4 0 256M 2097152words 1 5 .
LLCD 3 | 1 4 0 256M 2097152words 1 5 .
LLCD 4 | 1 4 0 256M 2097152words 1 5 .
LLCD 5 | 1 4 0 256M 2097152words 1 5 .
LLCD 6 | 1 4 0 256M 2097152words 1 5 .
LLCD 7 | 1 4 0 256M 2097152words 1 5 .
LLCD 8 | 1 4 0 256M 2097152words 1 5 .
LLCD 9 | 1 4 0 256M 2097152words 1 5 .
LLCD 10 | 1 4 0 256M 2097152words 1 5 .
LLCD 11 | 1 4 0 256M 2097152words 1 5 .
LLCD 12 | 1 4 0 256M 2097152words 1 5 .
LLCD 13 | 1 4 0 256M 2097152words 1 5 .
LLCD 14 | 1 4 0 256M 2097152words 1 5 .
LLCD 15 | 1 4 0 256M 2097152words 1 5 .
LLCD 16 | 1 4 0 256M 2097152words 1 5 .
LLCD 17 | 1 4 0 256M 2097152words 1 5 .
LLCD 18 | 1 4 0 256M 2097152words 1 5 .
LLCD 19 | 1 4 0 256M 2097152words 1 5 .
LLCD 20 | 1 4 0 256M 2097152words 1 5 .
LLCD 21 | 1 4 0 256M 2097152words 1 5 .
Continue? (y/n)S1 Any Keyin>
| imple id rev memorytype memsize/bank bank softrev fail/.
--------------------------------------------------------------------------------
LLCD 22 | 1 4 0 256M 2097152words 1 5 .
LLCD 23 | 1 4 0 256M 2097152words 1 5 .
LLCD 24 | 1 4 0 256M 2097152words 1 5 .
LLCD 25 | 1 4 0 256M 2097152words 1 5 .
LLCD 26 | .
LLCD 27 | .
LLCD 28 | .
LPMU 1 | 1 1 3 . . . 0 .
LPMU 2 | 1 1 3 . . . 0 .
LPMU 3 | 1 1 3 . . . 0 .
LPMU 4 | 1 1 3 . . . 0 .
LRVI 1 | 1 1 2 . . . 0 .
LRVI 2 | 1 1 2 . . . 0 .
LRVI 3 | .
LIDDQ 1 | 1 3 0 . . . 1 .
LIDDQ 2 | 1 3 0 . . . 1 .
DCREFT | 1 1 3 . . . 2 .
Continue? (y/n)S1 Any Keyin>
| imple id rev memorytype memsize/bank bank softrev fail/.
------------+-------------------------------------------------------------------
GSLM | 1 1 3 . . . 0 .
GSTR | 1 . 0 . . . 1 .
LSTM | 1 1 2 . . . - .
PAC1 | 1 6 1 256M 67108864words 1 0 .
PAC2 | 1 6 1 256M 67108864words 1 0 .
PACN | 1 6 1 256M 67108864words 1 0 .
NSMC | 1 1 3 256M 67108864words 1 1 .
LMIF | 1 1 1 256M 67108864words 1 0 .
GSTRPC | .
| imple address
--------------------------------------------------------------------------------
ARRAYUNIT(TSC)| 1 127.0.0.1
S1(eng)>
S1(eng)>
S1(eng)>.
Level3 Diag:
<<<===== diag nsdutpath =====>>>
<Integrated result log>
NSIO DUT Path Test(diag nsdutpath)------------------------------- PASS>
Start Time:2013/07/20 19:34:44
End Time:2013/07/20 19:34:58
Exec Diag Level:3
Diag Ver:V1.01 Station-Number:1 TesterID:ST02
1:DUT Path------------------------------------------------- <PASS>
2:Path Resistance------------------------------------------ <PASS>
<Fail data>
Fail data does not exist!
<<<===== diag hsdutpath =====>>>
<Integrated result log>
HSIO DUT Path Test(diag hsdutpath)------------------------------- <PASS>
Start Time:2013/07/20 19:35:08
End Time:2013/07/20 19:35:11
Exec Diag Level:3
Diag Ver:V1.01 Station-Number:1 TesterID:ST02
1:DUT Path------------------------------------------------- <PASS>
2:Path Resistance------------------------------------------ <PASS>
<Fail data>
Fail data does not exist!
<<<===== diag dfdutpath =====>>>
<Integrated result log>
DIHD DUT Path Test(diag dfdutpath)------------------------------- <PASS>
Start Time:2013/07/20 19:35:17
End Time:2013/07/20 19:35:20
Exec Diag Level:3
Diag Ver:V1.03 Station-Number:1 TesterID:ST02
1:DUT Path------------------------------------------------- <PASS>
2:Path Resistance------------------------------------------ <PASS>
<Fail data>
Fail data does not exist!
<<<===== diag rvidutpath =====>>>
<Integrated result log>
RVI DUT Path Test(diag rvidutpath)------------------------------- <PASS>
Start Time:2013/07/20 19:35:25
End Time:2013/07/20 19:35:27
Exec Diag Level:3
Diag Ver:V1.02 Station-Number:1 TesterID:ST02
1:DUT Path------------------------------------------------- <PASS>
2:Path Resistance------------------------------------------ <PASS>
<Fail data>
Fail data does not exist!
<<<===== diag uvidutpath =====>>>
<Integrated result log>
UVI DUT Path Test(diag uvidutpath)------------------------------- <PASS>
Start Time:2013/07/20 19:35:32
End Time:2013/07/20 19:35:40
Exec Diag Level:3
Diag Ver:V1.02R3 Station-Number:1 TesterID:ST02
1:DUT Path------------------------------------------------- <PASS>
2:Path Resistance------------------------------------------ <PASS>
<Fail data>
Fail data does not exist!
<<<===== diag lcddutpath =====>>>
<Integrated result log>
LCD DUT Path Test(diag lcddutpath)------------------------------- <PASS>
Start Time:2013/07/20 19:35:46
End Time:2013/07/20 19:36:56
Exec Diag Level:3
Diag Ver:V1.02R2 Station-Number:1 TesterID:ST02
1:DUT Path------------------------------------------------- <PASS>
2:Path Resistance------------------------------------------ <PASS>
<Fail data>
Fail data does not exist!
<<<===== diag pdmdutpath =====>>>
<Integrated result log>
PDM DUT Path Test(diag pdmdutpath)------------------------------- <PASS>
Start Time:2013/07/20 19:37:01
End Time:2013/07/20 19:37:02
Exec Diag Level:3
Diag Ver:V1.01 Station-Number:1 TesterID:ST02
1:DUT Path------------------------------------------------- <PASS>
<Fail data>
Fail data does not exist!
<<<===== diag refdutpath =====>>>
<Integrated result log>
Reference DUT Path Test(diag refdutpath)------------------------- <PASS>
Start Time:2013/07/20 19:37:07
End Time:2013/07/20 19:37:07
Exec Diag Level:3
Diag Ver:V1.04 Station-Number:1 TesterID:ST02
1:GVG Reference Output Path-------------------------------- <PASS>
3:LS Input Path-------------------------------------------- <PASS>
<Fail data>
Fail data does not exist!
<<<===== diag iddqdutpath =====>>>
<Integrated result log>
IDDQ DUT Path Test(diag iddqdutpath)----------------------------- <PASS>
Start Time:2013/07/20 19:37:13
End Time:2013/07/20 19:37:14
Exec Diag Level:3
Diag Ver:V1.01R2 Station-Number:1 TesterID:ST02
1:DUT Path------------------------------------------------- <PASS>
<Fail data>
Fail data does not exist!
<<<===== diag dfrly =====>>>
<Integrated result log>
DIHD Relay Test(diag dfrly)-------------------------------------- <PASS>
Start Time:2013/07/20 19:37:19
End Time:2013/07/20 19:37:21
Exec Diag Level:3
Diag Ver:V1.01 Station-Number:1 TesterID:ST02
1:DIHDENB Relay-------------------------------------------- <PASS>
<Fail data>
Fail data does not exist!
<<<===== diag lcdpmurly =====>>>
<Integrated result log>
LCDPMU Relay Test(diag lcdpmurly)-------------------------------- <PASS>
Start Time:2013/07/20 19:37:27
End Time:2013/07/20 19:37:43
Exec Diag Level:3
Diag Ver:V1.01R2 Station-Number:1 TesterID:ST02
1:DIR Relay------------------------------------------------ <PASS>
2:MTX Relay------------------------------------------------ <PASS>
3:LINE Relay----------------------------------------------- <PASS>
<Fail data>
Fail data does not exist!
<<<===== diag rvirly =====>>>
<Integrated result log>
RVI Relay Test(diag rvirly)-------------------------------------- <PASS>
Start Time:2013/07/20 19:37:49
End Time:2013/07/20 19:37:51
Exec Diag Level:3
Diag Ver:V1.01R2 Station-Number:1 TesterID:ST02
1:DIR Relay------------------------------------------------ <PASS>
2:MTX Relay------------------------------------------------ <PASS>
3:LINE Relay----------------------------------------------- <PASS>
<Fail data>
Fail data does not exist!
<<<===== diag iddqrly =====>>>
<Integrated result log>
IDDQ Relay Test(diag iddqrly)------------------------------------ <PASS>
Start Time:2013/07/20 19:37:57
End Time:2013/07/20 19:37:58
Exec Diag Level:3
Diag Ver:V1.01R2 Station-Number:1 TesterID:ST02
1:DUVIHF Rly On Resistance--------------------------------- <PASS>
2:LUVIHF Rly On Resistance--------------------------------- <PASS>
3:LIDDQHF Rly On Resistance-------------------------------- <PASS>
4:IDDQABHF Rly On Resistance------------------------------- <PASS>
5:L2JUMPHF Rly On Resistance------------------------------- <PASS>
6:L4JUMPHF Rly On Resistance------------------------------- <PASS>
<Fail data>
Fail data does not exist!
<<<===== diag lcdpmupath =====>>>
<Integrated result log>
LCDPMU Path Test(diag lcdpmupath)-------------------------------- <PASS>
Start Time:2013/07/20 19:38:04
End Time:2013/07/20 19:38:06
Exec Diag Level:3
Diag Ver:V1.01R2 Station-Number:1 TesterID:ST02
1:LCDPMU Internal Path------------------------------------- <PASS>
2:LCDPMU Guard Path---------------------------------------- <PASS>
<Fail data>
Fail data does not exist!
<<<===== diag rvipath =====>>>
<Integrated result log>
RVI Path Test(diag rvipath)-------------------------------------- <PASS>
Start Time:2013/07/20 19:38:12
End Time:2013/07/20 19:38:14
Exec Diag Level:3
Diag Ver:V1.02R2 Station-Number:1 TesterID:ST02
1:RVI Internal Path---------------------------------------- <PASS>
2:RVI Guard Path------------------------------------------- <PASS>
<Fail data>
Fail data does not exist!
<<<===== diag lcdpath =====>>>
<Integrated result log>
LCD DC Path Test(diag lcdpath)----------------------------------- <PASS>
Start Time:2013/07/20 19:38:20
End Time:2013/07/20 19:40:59
Exec Diag Level:3
Diag Ver:V1.03 Station-Number:1 TesterID:ST02
1:LCD DC Path---------------------------------------------- <PASS>
2:LCDCARD Path--------------------------------------------- <PASS>
3:LCDCARD RLYOFF------------------------------------------- <PASS>
<Fail data>
Fail data does not exist!
<<<===== diag iddqpath =====>>>
<Integrated result log>
IDDQ Path Test(diag iddqpath)------------------------------------ <PASS>
Start Time:2013/07/20 19:41:05
End Time:2013/07/20 19:41:06
Exec Diag Level:3
Diag Ver:V1.01 Station-Number:1 TesterID:ST02
1:IDDQ Internal Path--------------------------------------- <PASS>
<Fail data>
Fail data does not exist!
<<<===== diag sysdcpath =====>>>
<Integrated result log>
System DC Path Test(diag sysdcpath)------------------------------ <PASS>
Start Time:2013/07/20 19:41:13
End Time:2013/07/20 19:41:16
Exec Diag Level:3
Diag Ver:V1.02 Station-Number:1 TesterID:ST02
1:UVI-LINE Path-------------------------------------------- <PASS>
2:PDMpath-------------------------------------------------- <PASS>
3:RVI-LINE Path-------------------------------------------- <PASS>
4:LCDPMU-LINE Path----------------------------------------- <PASS>
5:LCD-LINE Path-------------------------------------------- <PASS>
6:I/O Calibration Path------------------------------------- <PASS>
7:LCDMTX Jump Path----------------------------------------- <PASS>
<Fail data>
Fail data does not exist!
<<<===== diag syslcdpath =====>>>
<Integrated result log>
System LCD Path Test(diag syslcdpath)---------------------------- <PASS>
Start Time:2013/07/20 19:41:21
End Time:2013/07/20 19:41:22
Exec Diag Level:3
Diag Ver:V1.02 Station-Number:1 TesterID:ST02
1:Digitize Data Trans Path.-------------------------------- <PASS>
<Fail data>
Fail data does not exist!
<<<===== diag nsstmpath =====>>>
<Integrated result log>
NSIO-STM Path Test(diag nsstmpath)------------------------------- <PASS>
Start Time:2013/07/20 19:41:28
End Time:2013/07/20 19:41:32
Exec Diag Level:3
Diag Ver:V1.02 Station-Number:1 TesterID:ST02
1:NSIO-STM HCMP Path--------------------------------------- <PASS>
2:NSIO-STM LCMP Path--------------------------------------- <PASS>
<Fail data>
Fail data does not exist!
<<<===== diag hsstmpath =====>>>
<Integrated result log>
HSIO-STM Path Test(diag hsstmpath)------------------------------- <PASS>
Start Time:2013/07/20 19:41:38
End Time:2013/07/20 19:41:39
Exec Diag Level:3
Diag Ver:V1.01 Station-Number:1 TesterID:ST02
1:HSIO-STM HCMP Path--------------------------------------- <PASS>
2:HSIO-STM LCMP Path--------------------------------------- <PASS>
<Fail data>
Fail data does not exist!
<<<===== diag lcdstmpath =====>>>
<Integrated result log>
LCD-STM Path Test(diag lcdstmpath)------------------------------- <PASS>
Start Time:2013/07/20 19:41:45
End Time:2013/07/20 19:41:45
Exec Diag Level:3
Diag Ver:V1.01 Station-Number:1 TesterID:ST02
1:LCD-STM HCMP Path---------------------------------------- <PASS>
2:LCD-STM LCMP Path---------------------------------------- <PASS>
<Fail data>
Fail data does not exist!
<<<===== diag dcreftfunc =====>>>
<Integrated result log>
DCREFT Function Test(diag dcreftfunc)---------------------------- <PASS>
Start Time:2013/07/20 19:41:52
End Time:2013/07/20 19:41:58
Exec Diag Level:3
Diag Ver:V1.01R2 Station-Number:1 TesterID:ST02
1:Power-supply Voltage------------------------------------- <PASS>
2:Internal Ref. Output------------------------------------- <PASS>
3:External Ref. Output------------------------------------- <PASS>
4:PDM Ref. Input------------------------------------------- <PASS>
5:LPMU/LRVI Ref. Output------------------------------------ <PASS>
6:LLCD Ref. Output----------------------------------------- <PASS>
7:MTX Path------------------------------------------------- <PASS>
8:Other Function------------------------------------------- <PASS>
<Fail data>
Fail data does not exist!
<<<===== diag nsfunc =====>>>
<Integrated result log>
NSIO Function Test(diag nsfunc)---------------------------------- <PASS>
Start Time:2013/07/20 19:42:21
End Time:2013/07/20 19:42:53
Exec Diag Level:3
Diag Ver:V1.02 Station-Number:1 TesterID:ST02
1:Pattern Generation--------------------------------------- <PASS>
2:Format Operation----------------------------------------- <PASS>
3:RTTC Operation------------------------------------------- <PASS>
4:Rate RTTC Operation-------------------------------------- <PASS>
5:SQPG Instruction----------------------------------------- <PASS>
6:Fail Test------------------------------------------------ <PASS>
<Detailed result log>
NSIO Function Test(diag nsfunc)
patgen1 : 1:Pattern Generation(Pattern RUN & STOP)----------- <PASS>
--------------------------------------
P/F Result Expect
--------------------------------------
P Current Address : 16 16
P Cycle Count : 17 17
--------------------------------------
format1 : 2:Format Operation(NRZ(Normal Pattern))------------ <PASS>
format2 : 2:Format Operation(RZ (Normal Pattern))------------ <PASS>
format3 : 2:Format Operation(R1 (Normal Pattern))------------ <PASS>
format4 : 2:Format Operation(SBC(Normal Pattern))------------ <PASS>
format5 : 2:Format Operation(NRZ(Double Pattern))------------ <PASS>
format6 : 2:Format Operation(RZ (Double Pattern))------------ <PASS>
format7 : 2:Format Operation(R1 (Double Pattern))------------ <PASS>
format8 : 2:Format Operation(SBC(Double Pattern))------------ <PASS>
format9 : 2:Format Operation(NRZ(Triple Pattern))------------ <PASS>
format10 : 2:Format Operation(RZ (Triple Pattern))------------ <PASS>
format11 : 2:Format Operation(R1 (Triple Pattern))------------ <PASS>
rttc1 : 3:RTTC Operation(RTTC Address Bit0)---------------- <PASS>
rttc2 : 3:RTTC Operation(RTTC Address Bit1)---------------- <PASS>
rttc3 : 3:RTTC Operation(RTTC Address Bit2)---------------- <PASS>
rttc4 : 3:RTTC Operation(RTTC Address Bit3)---------------- <PASS>
rttc5 : 3:RTTC Operation(RTTC Address Bit4)---------------- <PASS>
raterttc1 : 4:Rate RTTC Operation(Rate RTTC Address Bit0)------ <PASS>
raterttc2 : 4:Rate RTTC Operation(Rate RTTC Address Bit1)------ <PASS>
raterttc3 : 4:Rate RTTC Operation(Rate RTTC Address Bit2)------ <PASS>
raterttc4 : 4:Rate RTTC Operation(Rate RTTC Address Bit3)------ <PASS>
raterttc5 : 4:Rate RTTC Operation(Rate RTTC Address Bit4)------ <PASS>
pginst1 : 5:SQPG Instruction(Pattern Address Trace)---------- <PASS>
failtest1 : 6:Fail Test(Operation at PASS)--------------------- <PASS>
failtest2 : 6:Fail Test(Operation at FAIL)--------------------- <PASS>
<Fail data>
Fail data does not exist!
<<<===== diag hsfunc =====>>>
<Integrated result log>
HSIO Function Test(diag hsfunc)---------------------------------- <PASS>
Start Time:2013/07/20 19:43:17
End Time:2013/07/20 19:43:24
Exec Diag Level:3
Diag Ver:V1.02 Station-Number:1 TesterID:ST02
1:Pattern Generation--------------------------------------- <PASS>
2:Format Operation----------------------------------------- <PASS>
3:RTTC Operation------------------------------------------- <PASS>
4:Rate RTTC Operation-------------------------------------- <PASS>
5:SQPG Instruction----------------------------------------- <PASS>
6:Fail Test------------------------------------------------ <PASS>
<Detailed result log>
HSIO Function Test(diag hsfunc)
patgen1 : 1:Pattern Generation(Pattern RUN & STOP)----------- <PASS>
--------------------------------------
P/F Result Expect
--------------------------------------
P Current Address : 16 16
P Cycle Count : 17 17
--------------------------------------
format1 : 2:Format Operation(NRZ(Normal Pattern))------------ <PASS>
format2 : 2:Format Operation(RZ (Normal Pattern))------------ <PASS>
format3 : 2:Format Operation(R1 (Normal Pattern))------------ <PASS>
format4 : 2:Format Operation(SBC(Normal Pattern))------------ <PASS>
format5 : 2:Format Operation(NRZ(Double Pattern))------------ <PASS>
format6 : 2:Format Operation(RZ (Double Pattern))------------ <PASS>
format7 : 2:Format Operation(R1 (Double Pattern))------------ <PASS>
format8 : 2:Format Operation(SBC(Double Pattern))------------ <PASS>
format9 : 2:Format Operation(NRZ(Triple Pattern))------------ <PASS>
format10 : 2:Format Operation(RZ (Triple Pattern))------------ <PASS>
format11 : 2:Format Operation(R1 (Triple Pattern))------------ <PASS>
rttc1 : 3:RTTC Operation(RTTC Address Bit0)---------------- <PASS>
rttc2 : 3:RTTC Operation(RTTC Address Bit1)---------------- <PASS>
rttc3 : 3:RTTC Operation(RTTC Address Bit2)---------------- <PASS>
rttc4 : 3:RTTC Operation(RTTC Address Bit3)---------------- <PASS>
rttc5 : 3:RTTC Operation(RTTC Address Bit4)---------------- <PASS>
raterttc1 : 4:Rate RTTC Operation(Rate RTTC Address Bit0)------ <PASS>
raterttc2 : 4:Rate RTTC Operation(Rate RTTC Address Bit1)------ <PASS>
raterttc3 : 4:Rate RTTC Operation(Rate RTTC Address Bit2)------ <PASS>
raterttc4 : 4:Rate RTTC Operation(Rate RTTC Address Bit3)------ <PASS>
raterttc5 : 4:Rate RTTC Operation(Rate RTTC Address Bit4)------ <PASS>
pginst1 : 5:SQPG Instruction(Pattern Address Trace)---------- <PASS>
failtest1 : 6:Fail Test(Operation at PASS)--------------------- <PASS>
failtest2 : 6:Fail Test(Operation at FAIL)--------------------- <PASS>
<Fail data>
Fail data does not exist!
<<<===== diag lcdpmufunc =====>>>
<Integrated result log>
LCDPMU Function Test(diag lcdpmufunc)---------------------------- <PASS>
Start Time:2013/07/20 19:43:31
End Time:2013/07/20 19:43:32
Exec Diag Level:3
Diag Ver:V1.01 Station-Number:1 TesterID:ST02
1:ADC Measurement Function--------------------------------- <PASS>
<Detailed result log>
LCDPMU Function Test(diag lcdpmufunc)
measADC1 : 1:ADC Measurement Function(V=0V, RNG=X1)--------- <PASS>
----------------------------------------------------------------
PF CH Value[LSB]([V]) L-Limit[LSB]([V]) U-Limit[LSB]([V])
----------------------------------------------------------------
P 1 0x7fc9(+0.00210) 0x7f3b(+0.00750) 0x80c4(-0.00750)
P 7 0x7fb0(+0.00305) 0x7f3b(+0.00750) 0x80c4(-0.00750)
P 13 0x7f9b(+0.00385) 0x7f3b(+0.00750) 0x80c4(-0.00750)
P 19 0x7fb6(+0.00282) 0x7f3b(+0.00750) 0x80c4(-0.00750)
P 25 0x7f98(+0.00397) 0x7f3b(+0.00750) 0x80c4(-0.00750)
P 31 0x7fc2(+0.00237) 0x7f3b(+0.00750) 0x80c4(-0.00750)
P 37 0x7fbc(+0.00259) 0x7f3b(+0.00750) 0x80c4(-0.00750)
P 43 0x7fb7(+0.00278) 0x7f3b(+0.00750) 0x80c4(-0.00750)
P 49 0x7fc9(+0.00210) 0x7f3b(+0.00750) 0x80c4(-0.00750)
P 55 0x7fc4(+0.00229) 0x7f3b(+0.00750) 0x80c4(-0.00750)
P 61 0x7fbf(+0.00248) 0x7f3b(+0.00750) 0x80c4(-0.00750)
P 67 0x7fc1(+0.00240) 0x7f3b(+0.00750) 0x80c4(-0.00750)
P 73 0x7fc4(+0.00229) 0x7f3b(+0.00750) 0x80c4(-0.00750)
P 79 0x7fc9(+0.00210) 0x7f3b(+0.00750) 0x80c4(-0.00750)
P 85 0x7fb2(+0.00298) 0x7f3b(+0.00750) 0x80c4(-0.00750)
P 91 0x7fcb(+0.00202) 0x7f3b(+0.00750) 0x80c4(-0.00750)
----------------------------------------------------------------
measADC2 : 1:ADC Measurement Function(V=0V, RNG=X5)--------- <PASS>
----------------------------------------------------------------
PF CH Value[LSB]([V]) L-Limit[LSB]([V]) U-Limit[LSB]([V])
----------------------------------------------------------------
P 1 0x8009(-0.00034) 0x7c28(+0.03750) 0x83d7(-0.03750)
P 7 0x7fa7(+0.00340) 0x7c28(+0.03750) 0x83d7(-0.03750)
P 13 0x7f32(+0.00786) 0x7c28(+0.03750) 0x83d7(-0.03750)
P 19 0x7f8f(+0.00431) 0x7c28(+0.03750) 0x83d7(-0.03750)
P 25 0x7f1c(+0.00870) 0x7c28(+0.03750) 0x83d7(-0.03750)
P 31 0x7ff7(+0.00034) 0x7c28(+0.03750) 0x83d7(-0.03750)
P 37 0x7fbd(+0.00256) 0x7c28(+0.03750) 0x83d7(-0.03750)
P 43 0x7fad(+0.00317) 0x7c28(+0.03750) 0x83d7(-0.03750)
P 49 0x8004(-0.00015) 0x7c28(+0.03750) 0x83d7(-0.03750)
P 55 0x7fe5(+0.00103) 0x7c28(+0.03750) 0x83d7(-0.03750)
P 61 0x7fe6(+0.00099) 0x7c28(+0.03750) 0x83d7(-0.03750)
P 67 0x7fe7(+0.00095) 0x7c28(+0.03750) 0x83d7(-0.03750)
P 73 0x7fea(+0.00084) 0x7c28(+0.03750) 0x83d7(-0.03750)
P 79 0x800c(-0.00046) 0x7c28(+0.03750) 0x83d7(-0.03750)
P 85 0x7f94(+0.00412) 0x7c28(+0.03750) 0x83d7(-0.03750)
P 91 0x801b(-0.00103) 0x7c28(+0.03750) 0x83d7(-0.03750)
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measADC3 : 1:ADC Measurement Function(V=0V, RNG=X10)-------- <PASS>
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PF CH Value[LSB]([V]) L-Limit[LSB]([V]) U-Limit[LSB]([V])
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P 1 0x805b(-0.00347) 0x7851(+0.07500) 0x87ae(-0.07500)
YOKOGAWA ST 6730 is a multi-function and user friendly final test equipment used for inspection and product testing purposes. It is a combination of both electrical and optical test technologies. It also features a 6.4-inch external display with touch panel and intuitive software that enables end users to develop test programs without any assistance from the professionals, making the system perfect for use in production lines. ST 6730 is equipped with two high speed 8-bit ADC's and 8-channel multiplexer providing an incredibly fast testing rate, and 16-bit external memory for saving and loading of test patterns. The unit also features an 8-channel analog bus interface and a high-performance 5.7-inch touch panel LCD display along with dedicated software that allows for project-based programming and easy parameter optimization. YOKOGAWA ST 6730 includes a range of analog, digital I/O and special switching modules to ensure it is flexible enough to adapt to any testing environment. It also includes additional external input devices such as frequency generators, oscilloscopes and multimeters, allowing for accurate measurements and more detailed control over the final test machine. ST 6730 provides comprehensive functionality to users with its comprehensive connectivity options. These include Ethernet, RS-232C, USB, GP-IB port, SD card and FireWire. This wide array of connectivity options enables the user to access data over local or remote networks. The tool also offers a unique architecture that supports multiple user access, allowing users to access the asset from any given terminal. Overall, YOKOGAWA ST 6730 is a comprehensive final test model that provides reliable, versatile and easy to use testing solutions with high accuracy output. Offering a wide range of functions and features such as high speed 8-bit ADC's, 8-channel multiplexing, 8-channel analog bus, external input device and multiple user features, this equipment is the perfect choice for any testing and inspection needs.
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