Used YOKOGAWA ST 67LMF #293660917 for sale

Manufacturer
YOKOGAWA
Model
ST 67LMF
ID: 293660917
System.
YOKOGAWA ST 67LMF is an advanced final test equipment used for integrated circuit and module-based packages. It consists of an automated testing station, a probe head, and a dynamic personality device card. The automated testing station controls the testing processes and is equipped with multiple probe tips, an input/output interface, and a dedicated test controller. The probe head features an integrated test head, which is equipped with a high-precision probe tip and includes an internal signal generator. The dynamic personality device card contains a number of integrated circuit personality storage registers, which can be used to store circuit configurations and parameters. ST 67LMF can test a range of packages, including small packages (TQFP and others) with up to 45 contacts, and large packages (BGA and others) with up to 400 contacts. Its high speed probing and high resolution data acquisition systems are capable of scanning and measuring in nanoseconds. The system can also perform wide range testing functions, such as power dissipation, leakage, transient tests, and more. YOKOGAWA ST 67LMF is designed with user-friendly features to facilitate test operation. Its intuitive human-machine interface features an on-screen monitor and intuitive menu-driven commands that allow users to set up tests quickly and accurately. The unit also features built-in programs that allow users to easily program a series of tests. In addition, ST 67LMF is designed to be both reliable and durable. It possesses superior long-term stability, ensuring that its accuracy is maintained throughout its lifetime. It is also fitted with an automatic cleaning machine, which prevents dust from accumulating and impairing its performance. Overall, YOKOGAWA ST 67LMF is a highly advanced final test tool for integrated circuits and module-based packages. Its efficient testing processes, intuitive user interface, and superior reliability make it an ideal choice for testing operations in the electronics industry.
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