Used YOKOGAWA TS 100 #293658776 for sale

YOKOGAWA TS 100 is a final test equipment for evaluating the performance and operational characteristics of components and devices. TS 100 is capable of testing a wide range of digital and analog components, ranging from large semiconductor packages to single passive devices. The system has a versatile test architecture, allowing tests to be conducted with multiple channels or single-channel configurations. The unit is capable of testing frequency response, machine open loop, linearity, and power response. The tool is designed to increase test throughput, reliability, and accuracy. It has a hybrid asset architecture with analog, digital, and embedded components. For example, the model has a high-speed signal processor, a real-time test module, embedded micro-controllers, and a high-speed waveform generator. The equipment also has an automated tester station, enabling high-speed and accurate testing of any device or component. The system is designed to be easy to use and understand. It has intuitive controls, graphical user interface, batch processing, and data management features. These features enable users to quickly and accurately test a wide range of components and devices. It also has an in-line test capability, allowing users to test their samples without manual intervention. The unit is designed for reliability and durability. It contains a custom-built, embedded micro-controller, which offers reliable and consistent test results over long runs. It also has several integrated test programmers, helping users to program complex testing protocols without the need for manual intervention. In addition, the machine is designed to perform data logging and logging to an external database, helping users to store and analyze large amounts of test data. YOKOGAWA TS 100 is an excellent solution for testing a wide range of components and devices. Its innovative hybrid tool architecture, intuitive controls, embedded micro-controller, and integrated test programmers make it an ideal choice for evaluating performance and operational characteristics of components and devices.