Used ADVANTEST M 6300 #9157596 for sale

ADVANTEST M 6300 Handler is a high-speed, multi-site wafer-handling solution designed for cost-effective testing and handling of large and small wafers. ADVANTEST M6300 handler is capable of handling wafers ranging in size from 200mm to 150mm and of offering a throughput of up to 5,000 wafers per hour. This robust handler offers an integrated single cassette extending from 150mm to 240mm along with flexible and ergonomic wafer transfer devices. M 6300 handler offers greater accuracy during wafer transfer and aligning thanks to its vision system and high-speed movement of wafer handlers. This ensures that the wafers are accurately aligned to critical test parameters, leading to improved accuracy and reliability of testing. The handler can also be integrated with other test equipment to provide an automated, defect-free test environment. The handler can be configured with a range of test sockets, adapters, and bayonets or cartridges for the most efficient testing process. The handler is engineered for universal application and designed to meet the demands of extreme operating environment including clean room, corrosive, and humid environment. This helps the handler to accommodate its use in a wide range of industries and applications such as electronics, automotive, medical, and industrial. Easily reconfigured, M6300 handler is equipped with advanced options to ensure the highest throughput and flexibility. When configured with ADVANTEST CAdvantage software, ADVANTEST M 6300 handler can also deliver an array of innovative, intelligent functions such as testing at multiple temperature levels, identifying data of handled wafers, automatic error detection, and real-time data recordation and analysis. The handler also provides automatic diagnosis and provides an industry-standard communication interface for firmware updates and maintenance alerts. The advanced technology of ADVANTEST M6300 handler assures users of highest quality testing and maximized throughput, ultimately leading to improved cost-efficiency in testing of advanced nodes. The robust design and modern features of M 6300 handler deliver an unmatched combination of reliability, performance, and accuracy for efficient wafer testing.