Used ADVANTEST M 6300 #9200142 for sale

ADVANTEST M 6300 handler is a high-performance, programmable and automated component handler designed for testing discrete semiconductors. This flexible and reliable handler is ideal for high-volume testing of memory devices, logic devices, image sensors, and other miniature components. ADVANTEST M6300 handler has a moveable, ventilated base for easy transportation and offers the latest technology in compact package technology testing (CPT). It is capable of simultaneous processing up to 96 UUTs, with throughput rates of up to 160 UPH. It is able to test a wide range of temperatures and provides multiple options for route programing. For accurate and precise component testing, M 6300 features self-controlled motion capabilities and advanced torque sensing technology ensuring that components are handled delicately and securely. The handler comes equipped with high-speed vision systems, inspection cameras, and powerful image analytic algorithms. It also provides automatic recognition of multiple packages such as SO, TSOP, LQFP, TSOP, and FBGA. M6300 handler also offers advanced process control when testing sensitive components such as MEMS, image sensors, and microphone arrays. The real-time monitoring and tracking of process parameters like temperature, pressure, and current during test execution eliminates the need for separate precision measurement systems. The handler is equipped with a variety of fixtures for specialized component testing and is capable of up to 30 pick-and-place events in the same testing cycle. ADVANTEST M 6300 handler is also capable of a variety of testing methods, including drop testing, input/output tests, as well as electrical properties testing. It is compatible with most of the leading testing solutions, making it an ideal choice for production facilities and research labs. The handler is designed to reduce human intervention and data collection errors and is compliant with IEC and Semiconductor industry standards to ensure accuracy.