Used ADVANTEST M 6300 #9407149 for sale

ADVANTEST M 6300 handler is an advanced semiconductor testing solution designed to support high-end devices. It provides automated testing of integrated circuits (ICs) of all types, including mixed-signal, analog, digital, and optoelectronic devices. The equipment is equipped with a TEG+ test platform that supports high-speed testing of up to 20,000 pins/second in a single handler. It also has the ability to operate in an efficient production environment, working at a much lower cost than its competitors. ADVANTEST M6300 handler has an advanced multi-site probing capability that enables high-speed parallel testing of multiple ICs simultaneously. This provides maximum throughput and increases the number of effectively tested devices. The system also features die-by-die probing, allowing for efficient testing of tiny chips. This technology is especially useful for MEMS and ASICs where the size of the die is usually small. The unit supports a number of communication interfaces and is compatible with several third-party loadboards such as SureTest, Datacon Systems, Teledyne, and more. It has a direct fusion bonded probe tip, which ensures an effective transfer of RF signals and prevents signal losses due to inductance. M 6300 machine operates in synchronous and asynchronous mode, and it can be configured for either retail or engineering samples. The machine uses the Insite test technology, which supports efficient and cost-effective testing of various devices. ADVANTEST Enhanced Site Analysis (ESA) feature provides comprehensive data analysis and fault detection capabilities, allowing users to identify and resolve device design- or manufacturing-related failures. It also features multiple test programs, allowing users to easily switch between programs for a more efficient testing process. M6300 handler is a reliable and advanced semiconductor handler that efficiently supports high-speed production of mixed-signal, analog, digital, and optoelectronic devices. It has an advanced multi-site probing feature and a direct fusion-bonded probe tip, which ensures an effective signal transfer. Moreover, it supports efficient data analysis with its Insite test technology and Enhanced Site Analysis (ESA) feature. This makes ADVANTEST M 6300 handler an ideal choice for semiconductor manufacturers to ensure top-notch product quality.