Used ADVANTEST M 6541A #9155502 for sale
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ADVANTEST M 6541A handler is a state-of-the-art semiconductor testing equipment designed for high speed testing and reliable yields in the production of IC packages and wafers. It incorporates industry leading technology and innovative design features to enable rapid throughput and advanced functions. The handler is equipped with a high speed eight-axis motion control system and a built-in high-speed testing unit that can accommodate up to 8,192 pins. It can support as many as 100,000 ICs per hour and can handle any combination of small-scale blocks, large-scale IC designs, and multi-site testing. ADVANTEST M6541A handler is composed of a primary body and a movable testing head. The body contains two independent stacking stations, each organized into two levels for efficient test storage. The upper level of the stacking station comprises a mobile tray for the easy transfer of product from the lower station to the main testing head. The testing head contains a series of independent linear and rotary motors that allow for precise movement in small increments with minimal vibration. This provides the operator with the ability to accurately align wafers and IC packages within extremely tight tolerance requirements. M6541 A handler incorporates a number of additional features that add to its testing capabilities. It includes a vision machine to precisely identify and manage pattern recognition for both the wafer and IC packages. It also includes a three-level switching tester which allows for three-step testing, such as destructive testing, in just one operation. M 6541 A also contains several other features that ensure reliability and accuracy, including signal integrity testing, analyzing measurement, tester control setting, and advanced signal injection. Overall, M6541A handler is an advanced testing tool designed to meet the rigorous demands of today's semiconductor production. It is equipped with leading technologies and features that enable fast throughput and reliable yields. It is robust, reliable, and accurate, making it an ideal choice for high speed semiconductor testing.
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