Used ADVANTEST M 6541AD #9119450 for sale

ADVANTEST M 6541AD handler is a powerful and versatile solution for automating the sorting, inspection, and test operations of integrated circuit (IC) chips. It is designed to present a wide variety of die sizes, types, and packages. The handler is capable of processing up to 50 depending on part die size and bump of lead pitch and classifying up to 500 parts per minute. It has an optimized test procedure that has been designed to minimize IC testing time and minimize processing errors. ADVANTEST M6541AD handler features three part separation mechanisms that allow for different types of parts to be automatically identified, sorted, and tested. A vibratory feeder facilitates sorting by using multiple vibrations to separate the wafers. A slim, curved surface and slope conveyor conveyor ensures packages of varying thicknesses can be detected and sorted. Lastly, a continuous pressure separation device separates individual parts so that each part can be tested independently. The unit boasts a highly efficient, and modular, design that makes it easy to customize and expand its control capabilities. M6541 AD handler supports a wide array of high-performance IC test equipment, including direct port access and RS232 interfaces, allowing for easy communication between the handler and the rest of the test station. In addition, the handler can also be linked to industry standard PCs and networks, enabling it to work with multiple peripheral devices. M6541AD handler is also designed with a number of features that provide reliable operation, including an active vibration control system that minimizes die movement during processing, removing the need for further manual die adjustments. The machine also features automated SPC approaches to ensure data accuracy. Furthermore, it offers a high degree of flexibility with regards to customization, allowing the user to alter and configure various parameters according to their needs. In conclusion, ADVANTEST M 6541 AD handler is an ideal solution for automating the sorting, inspection, and test operations of IC chips. It offers fast processing speeds, modularity, compatibility with multiple industry standard devices, and reliable performance. It is capable of sorting through large quantities of chips quickly while minimizing any errors or malfunctions in the process.