Used ADVANTEST M 6541AD #9247864 for sale

ADVANTEST M 6541AD
Manufacturer
ADVANTEST
Model
M 6541AD
ID: 9247864
Vintage: 2002
Dynamic test handlers 2002 vintage.
ADVANTEST M 6541AD is a handler designed to facilitate production and performance testing of integrated circuit (IC) devices. It is used primarily in the manufacturing of integrated circuits and related devices, such as Application Specific Integrated Circuits (ASICs), Field Programmable Gate Arrays (FPGAs) and Equipment on Chip (SoC) devices. The handler is designed with an automated wafer clamping system, which allows it to test up to 240 pieces of wafer chips quickly and accurately. It has a precise 3-D mapping unit which allows it to accurately locate the chips on the wafer before testing and supports Non-Contact-3D-Mapping technology for enhanced precision. It also comes equipped with an integrated wafer inspection microscope and automated visual inspection for precise characterization of the chips at 0.14 micron resolution. Additionally, ADVANTEST M6541AD handler features an advanced optical measurement machine, which includes a CCD (Charge Coupled Device) sensor as well as a range of optical alignment devices. This tool combines precision, accuracy and repeatability for high-quality testing of the devices. The handler also supports a range of Emission Test Head (ETH) voltage test heads, which help to detect problems with device electrical parameters quickly and accurately. Additionally, it comes with a built-in Wafer ID read head, which is used to read the Wafer ID so as to cross check and compare device performance data. Moreover, this testing asset supports a wide range of protocols, such as, IEEE488.2, IEC 68-5, JIS Z7803 and EIA5-12 for efficient communications between the handler and its PCs or test station. It also comes with a large touch screen display and dedicated soft keys, which allow for easy programming and parameter adjustment. Lastly, the model also features a built-in Ethernet-based communication equipment, which allows it to be connected with other test systems and PCs. This allows for efficient sharing and management of test data and results.
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