Used ADVANTEST M 6541AD #9298787 for sale

ADVANTEST M 6541AD is a high-speed handler is used for semiconductor device testing. It is an automated handler designed for use with many wafer sizes. It is capable of carrying up to 41 wafer frames and can be connected to various test systems from basic testers to automatic testing equipment (ATE) systems. The handler features high speed movement of wafers, with a transfer speed of up to 200mm/s and wafers can be transferred from station to station in as little as 1.6 seconds. The handler has a maximum wafer size of 200mm, a handling capacity of 8000 wafers per hour, and is capable of running up to 8 patterns in 60 seconds. ADVANTEST M6541AD has an easy to use controller equipment, which includes a Windows-based operator interface. This interface allows the user to operate the handler and set up parameters for the test system. The controller also features a 100Mb/s Fast Ethernet connection for remote monitoring and for data transmission. M6541 AD handler is a reliable and robust unit, with advanced mechanisms designed to reduce wafer breakage and provide precise positioning. The wafer-pick machine is designed for low noise operation and employs several types of sensors for accurate detection of wafers. In addition, the pick and place tool features pressure control for precise handling of wafers and the handler's transfer unit is driven by a linear servomotor for smooth and precise motion of the wafer cassette. M 6541AD handler has a user-friendly design and offers a high degree of flexibility, with a modular design that can be customized for specific testing requirements. The asset supports a wide range of semiconductor devices, including memory, logic, optical, and mixed-signal devices. It is compatible with various on-wafer testing systems and can be connected to LabView-based applications. Overall, M6541AD is an excellent handler for testing a range of semiconductor devices, enabling high speed and accurate device testing. Its flexibility, user-friendly design, reliability and robust features make it an ideal choice for semiconductor device testing.