Used ADVANTEST M 6541AD #9302532 for sale

ADVANTEST M 6541AD
Manufacturer
ADVANTEST
Model
M 6541AD
ID: 9302532
Wafer Size: 8"
Vintage: 2001
Testers, 8" 2001 vintage.
ADVANTEST M 6541AD is a compact, high speed Handler designed for the efficient testing of ICs with up to 2048 pins. It is equipped with advanced features such as dynamic test program conversion, on-the-fly mode change and total test time reduction. The Handler also features two field replaceable Magnetic Test Heads (MTH) for versatile testing requirements. ADVANTEST M6541AD is capable of accommodating both wafer and leaded packages, with a maximum IC size of 40mm x 40mm. It also enables multiple loading and unloading schemes including tray-to-tray and tape-to-tray. The test equipment includes an Auto-Inspection System (AIS) which is used to detect a variety of defects during the IC probing process. The test unit is equipped with both a high-speed vision machine and an adjacent area light source, as well as a wafer mapper/tracer. The high speed of M6541 AD is achieved through its advanced dynamic semiconductor test technology. Its dynamic test program conversion feature eliminates the need for users to re-program the tool whenever test parameters such as DUTs or pins change. The on-the-fly mode change feature reduces the time required to capture data by automatically switching between multiple test modes during testing. The total test time reduction feature is designed to maximize overall throughput by reducing the time required for testing each DUT. The Magnetic Test Head (MTH) is designed for ultimate test versatility. With programmable frequency and voltage combined with overdrive capability, the MTH allows for testing of a wide variety of ICs and packages. The MTH is equipped with a contact head heat exchanger which provides a safe and reliable connection between the IC and the tester. M 6541 AD Handler is designed for maximum efficiency in IC testing. With its advanced features and high speed, it is an ideal solution for high volume testing environments. and increasing throughput.
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