Used ADVANTEST M 6541AD #9311799 for sale

ADVANTEST M 6541AD is a high-speed, flexible, and reliable handler designed for wafer-level test, package test, system test, and burn-in test. This handler is capable of performing a wide variety of in-line tests with high performance. It is equipped with several features, which make it one of the most desirable handler in the semiconductor industry. ADVANTEST M6541AD has a high speed supply deck which allows for quicker testing of small packages and microelectronic devices with smaller pitches. Its automatic production line results in higher test efficiency and quality with the capability of quick modification for new product introduction. The handler incorporates a new wafer loading mechanism, which has a rapid navigator LED-based reader to precisely align the wafer and offer best-in-class accuracy. The handler has an advanced control system designed for superior performance and to meet the demands of the customer. Its fully automated test system is equipped with sophisticated test response algorithms and data analysis capabilities. M6541 AD also includes several other features such as user-friendly design, outstanding at-speed capability, intelligent safety systems, remote control and analysis, and a highly advanced software interface. In addition, ADVANTEST M 6541 AD has a very small footprint, taking up less space in the production process, and is designed to save on test costs and improve the efficiency of wafer testing. Additionally, this handler has a user-friendly operator-machine interface which allows for easier operation and transaction execution. M 6541 AD also supports multiple test nodes, which enables high throughput test of a variety of products. ADVANTEST M6541 AD handler is well-suited for small engineering-oriented applications including point-of-use test, characterization, and burn-in. This handler is highly reliable, robust, and cost-effective making it one of the most popular handlers in the industry. M 6541AD can be used for a variety of needs ranging from wafer level test to burn-in and package level test. It is an advanced and reliable tool for performing in-line tests with high performance.