Used ADVANTEST M 6541AD #9404437 for sale

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Manufacturer
ADVANTEST
Model
M 6541AD
ID: 9404437
Handler.
ADVANTEST M 6541AD is an automated test handler that is designed to meet the demands of high volume ATE (Automatic Test Equipment) testing. The unit is a single-slot design that can accommodate up to twelve boards, allowing for rapid throughput in the testing of complex electronic modules. It can be used for a variety of test protocols, such as JTAG (Joint Test Action Group) and ICT (In-Circuit Test). ADVANTEST M6541AD is capable of handling a variety of different package types, including BGA (Ball Grid Array), LGA (Land Grid Array), and TSOP (Thin Small Outline Package). It offers compatibility with a wide range of test adapters to allow for the flexibility needed for test development. The in-built handling system is designed for ease of use, with a simple drive mechanism providing smooth handling of the test boards throughout cycles. The drive mechanism ensures that boards are properly aligned and positioned with each loading. M6541 AD has a robust control system that is easy to integrate with existing ATE software. Its advanced control software can be used to configure and control the handler during testing, allowing for the smooth, reliable operation necessary for precision test results. The software also offers remote control capabilities, allowing for remote supervision of the handling system. M 6541AD includes a full suite of safety features, including door interlock and controls to prevent accidental activation of the unit while the handler is operating. In addition, it includes precision sensors and advanced position sensors that provide feedback in order to ensure reliable performance. ADVANTEST M 6541 AD is hardwired for 240V AC operation and requires no additional hardware for installation or use. With its compact size, ADVANTEST M6541 AD can be easily integrated into existing test equipment, providing a cost effective solution for testing a variety of different package types. M 6541 AD is a reliable and powerful solution for the ATE testing of today's advanced electronic devices.
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