Used ADVANTEST M 6721 #130666 for sale

ADVANTEST M 6721
Manufacturer
ADVANTEST
Model
M 6721
ID: 130666
Handler, parts system.
ADVANTEST M 6721 is an automatic test handler designed for use in semiconductor test applications. It is a high-speed, high-precision, low-cost solution and is suitable for use in a wide range of test configurations. The handler can accommodate multiple pins and up to 25 boards, allowing it to effectively process large batches of components. It also offers a variety of versatility, allowing multiple test types to be performed, such as parametric, functional, memory and boundary scan tests. For example, up to four wafer probers can be placed on the handler platform to enable high-speed wafer probing. M 6721 is composed of several components including a main frame, integrated timing board, a series of boards for controlling the test interface and test data acquisition, an optic load board, and an FDC (Fixture Drive Chest). The mainframe includes a robot arm that can be positioned in multiple directions, enabling it to pick parts precisely without collisions. In addition, the handler can easily be interfaced to the test station and fixtures, allowing one to quickly switch between test programs and board types. ADVANTEST M 6721 features advanced debug capabilities, diagnostic and monitoring features, and fault detection capabilities. These features, along with its flexibility and ease of use, make it ideal for high-volume production applications. The handler is also well-suited for failure analysis as it is capable of detecting and isolating faults in complex boards quickly and accurately. Moreover, M 6721 uses cutting-edge technology to increase the accuracy, speed and flexibility of the system. Its advanced automation technology enables one to monitor and control the test process from a remote location. In addition, its test program can be updated remotely, allowing the user to modify parameters in real-time to improve manufacturing efficiency. Overall, ADVANTEST M 6721 is an automated solution for producing large numbers of semiconductors. Its versatile design and advanced diagnostic, debugging and fault detection capabilities make it an ideal solution for high-volume production and analysis applications.
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