Used ADVANTEST M 6741A #9241013 for sale

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Manufacturer
ADVANTEST
Model
M 6741A
ID: 9241013
Handlers.
ADVANTEST M 6741A is a high-performance device handler that is designed to work with high-end semiconductor testing systems. The handler is fully automated and capable of executing up to 16 test programs in a single cycle. This allows users to maximize throughput and get results quickly. ADVANTEST M6741A is a four-stage handler that includes outfeed, transfer, test, and infeed stages. The outfeed stage enables efficient part feeding from the source tray to the transport stage. The transfer stage then transports parts between test and infeed stages, ensuring parts are in their original orientation. The test stage provides excellent test conditions and is capable of handling various devices, such as SOICs, BGA, and QFPs. Finally, the infeed stage returns the tested parts back to the source tray, ensuring maximum efficiency. This handler is also equipped with a number of features that make it versatile. It is capable of handling parts up to a maximum of 130mm, and the placed part tolerance is 0.3mm. The handler offers excellent temperature control, with a temperature variation of just ±1℃. Additionally, it allows for both transferred and fanned-out boards to be tested, with transferred boards being tested twice as fast as fanned-out boards. The handler is also compatible with a variety of testing equipment, including high-end systems from ADVANTEST, Tekronix, Teradyne, and more. Furthermore, M 6741A provides exceptional reliability, accuracy, and uptime. The handler has an MTBF of 820,000 hours, and the components used are designed and tested to ensure durability and longevity. This ensures that the equipment can handle multiple batches of tests without difficulty or downtime. Additionally, the handler is easy to maintain, with monthly cleaning requirements that can be completed in no more than an hour. Overall, M 6741A is an excellent device handler for high-end test systems. It offers exceptional speed, accuracy, and reliability, making it ideal for demanding test environments.
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