Used ADVANTEST M 6751AD #9259333 for sale

ADVANTEST M 6751AD is a high-performance handler designed for semiconductor device testing and device burn-in applications. The handler is designed to provide seamless support for any test architecture, including ATE, custom, universal, and BIST. The handler utilizes advanced technology to optimize test program operation, improve throughput, reduce system size, and lower cost. M 6751AD is equipped with a transfer mechanism, a switching table, a holding mechanism, and a loading mechanism. The transfer mechanism enables smooth and consistent transfer of devices between test sockets and holders. The switching table enables exact device placement between tester, handler, and burn-in board. The holding mechanism maintains secure device alignment on top of the testing sockets, thus minimizing contact stress and minimizing contamination. The loading mechanism automatically balances the pressure on the BGA pads, ensuring a reliable test contact. The handler is also equipped with a VGL (Variable Gain Logic) digital signal processor and a high-speed digital engine that enable fast and accurate signal analysis. The VGL DSP provides signal optimization and monitoring of all I/O signals throughout the test process. The digital engine offers quick device initialization, high quality test execution, and fast report generation. The handler is controlled by a multi-level, multi-threaded real-time operating system designed to operate in high-speed, complex environments. The operating system is compatible with scripting languages such as C, C++, and Java. In addition, the handler is equipped with a graphical user interface that allows operators to program tests quickly, monitor their status, and analyze results. ADVANTEST M 6751AD is designed for high-efficiency performance and maximum test throughput. It is suitable for medium- to high-speed test operations and is capable of executing several thousand tests per hour. With its advanced hardware and software architecture, the handler is able to support multiple test programs and devices simultaneously, thus improving overall productivity.