Used ADVANTEST M 6761 #9217650 for sale

ADVANTEST M 6761 is a modular, high-frequency, electrical testing handler designed particularly for semiconductor device testing. It provides automated, up to date capabilities that enable the testing of packages and bare dies for wafer level reliability and device characterization in semiconductor manufacturing environments. ADVANTEST M6761 handler is equipped with a variety of features that are essential for semiconductor device testing. It has a compact design that offers enhanced flexibility and convenience in the testing environment. The handler is designed to allow for easy transportation of samples for transport without compromising the performance of the device. The automated wafer handling system also allows for efficient testing and loading of wafers. M 6761 handler is designed with a number of high-frequency testing and measurement capabilities. It is capable of an integrated full temperature range testing capability (up to 200 ⁰C). It also has integrated DC parametric and fast switching (up to 200kHz). It is also equipped with a built-in 60V pulse generator for dynamic testing. Additionally, the handler is also equipped with a flash reverse current for breakdown testing, pulse width/phase measurement for device characterization, and multi-signal measurement for component analysis. M6761 handler is designed to be incredibly durable and reliable. Its integrated modular design allows for efficient testing with minimal maintenance requirements. The handler is also equipped with independent device test power supplies (IV and Vf) and a user selectable high-output power of 48V and 15A. Additionally, ADVANTEST M 6761 handler is also equipped with high-flow fans for effective cooling. Overall, ADVANTEST M6761 handler is a reliable, high-speed handler designed for efficient semiconductor device testing. Its automated wafer handling system allows for easy transport of samples without sacrificing performance. Additionally, its wide range of testing capabilities and high-performance features make it an ideal choice for semiconductor device testing.