Used ADVANTEST M 6761A #9157600 for sale

ADVANTEST M 6761A is a highly advanced and customizable Handler and IC Test Equipment that offers users a wide range of features and capabilities. The system is designed to provide testing and analysis of complex semiconductor devices quickly and accurately. M 6761A includes a multi-stage handler with high precision moveable stages and an electrical docking bay. It has the ability to interface with a host PC via GPIB, Ethernet, or RS232 for the control of test methods. ADVANTEST M 6761A is also capable of working in both stand-alone and networking configurations. The unit is capable of handling and testing a wide range of semiconductor devices including SO-DIMM, DRAM, Flash, Power ICs, discretes, and specialized discrete devices. It has the capability to handle the smallest die in the industry and offers precise pin probing and testing with minimal manipulation of the device. M 6761A offers features such as auto-calibration, high-speed testing, advanced diagnostics, and an intuitive and easy to use graphical user interface for controlling all test functions and parameters. The machine also supports multiple language settings for global test operations. The tool includes an array of dynamic test and analysis capabilities such as AC and DC Analog testing, Digital testing, Field-programmable gate array testing, and Automated Visual Inspection. The handler also provides access to different test heads and a wide array of probes that can be used for different types of tests. The asset has the capability to identify a wide range of anomalies in the test process such as shorts, opens, cross talk, and leakage. ADVANTEST M 6761A also has the ability to identify abnormal packaging, as well as problems with pin holes , bond wires, and more. M 6761A is an advanced handler and IC Test Model that offers reliability, flexibility, compatibility, and unparalleled accuracy in testing and analysis of complex semiconductor devices. With its array of features, it is an excellent choice for all semiconductor device production and testing needs.