Used ADVANTEST M 6761AD #9017485 for sale

ADVANTEST M 6761AD is a universal, modular, and flexible handler designed to meet a variety of WAT or WLT (wafer level test) needs. It integrates with existing wafer and component test hosts, and can provide a wide range of support for multiple devices under test and fixtures. The flexible, modular design of M 6761AD provides customers with a versatile and cost-effective solution for their wafer and device testing. ADVANTEST M 6761AD offers a reliable handling system that supports a variety of wafer sizes, ranging from 4 to 12 inches in diameter, as well as a variety of shaped packages and images. Its patented arm design ensures secure gripping and rapid transfer of wafers. The handler also supports two-dimensional modular fixture systems with high accuracy. Its advanced mechanical design also incorporates high-speed undocking that reduces changeover time of peripherals, providing a fast assembly of handler operations. M 6761AD is designed to support high-throughput, high-precision wafer testing. Its high-speed wipers quickly remove unnecessary material, and its equipment temperature control system provides optimal conditions for safe wafer handling. The handler provides full support for robotic transport, and its capable of operating at a high speed of up to 50 pieces per minute. It supports a wide variety of test applications, including dynamic wafer level test applications such as temperature sweeps. ADVANTEST M 6761AD also comes with an intuitive user interface, allowing customers to easily access various settings and configure their handler to run their desired test scenarios. The automated software also assists customers in setup, set-up validation and data logging. Multiple I/O devices can be connected to the handler as well, allowing customers to monitor their test results in real-time. In conclusion, M 6761AD is a reliable, versatile and cost-effective handler that provides customers with a comprehensive and flexible solution for WAT or WLT needs. Its patented arm design and high-speed transfer capabilities make it ideal for high-throughput, high-precision wafer testing. Its intuitive user interface and data logging capacities also allow customers to easily set up and monitor their device tests.