Used ADVANTEST M 6761AD #9081729 for sale

ADVANTEST M 6761AD
Manufacturer
ADVANTEST
Model
M 6761AD
ID: 9081729
Vintage: 1997
Memory test handler (64) Trip temps (6) Device bins JEDEC Input / Output 1997 vintage.
ADVANTEST M 6761AD is a handler for testing a wide variety of semiconductor devices, securely mounting the device onto the test head and handling the device in a quick, efficient and controlled manner. It is designed to simultaneously test up to 25 different types of devices, minimising the amount of time required to perform tests without compromising accuracy. The handler's maximum speed capability is 6.7kHz, providing a consistent flow of data throughput, and it also features rapid and accurate positioning with a response time of 0.8ms and 0.14mm repeat accuracy. The handler also has a 50-micron micro-step facility, offering repeatable repeatability of up to 1 x 10-6. The handler is extremely durable and has a long-term service life thanks to its rigid construction, stainless steel chassis and sealed design. It has a Global Fresh Air Cleaner which prevents contamination of test chips from particles and static electricity, eliminating the need for potentially hazardous cleaning agents. The handler also has a floating wafer arm which ensures tight pin-to-die control for even the most delicate devices. It also comes with a dual track wafer magazine which prevents overlapping and inconsistent handling of wafers. The handler has a graphical user interface with an alphanumeric keypad and a wide variety of Linux-based command controls for easy operation. It can be programmed to perform all types of semiconductor testing, from logic level and power level testing to specific functional tests. Additionally, the handler supports the use of highly flexible programmable test boards. In summary, M 6761AD is a high-performance, highly reliable handler which can safely handle continuous batches of 25 semiconductor devices. It offers fast throughputs, repeatable repeatability and contamination-free testing, making it an ideal choice for automated testing of semiconductor devices.
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