Used ADVANTEST M 6761AD #9247867 for sale

ADVANTEST M 6761AD is a device handler designed for the testing of integrated circuits used in memory, logic, and other chipsets. The device handler is ideal for fast and accurate testing of a wide variety of integrated circuits, allowing for quick changes in the test program and testing parameters. M 6761AD is a full-featured device handler, offering maximum flexibility and versatility in testing operations. It offers the user features such as Single and Multi-Slot testing, List/Listless Programming, and Multi-Function Testing. The Single and Multi-Slot testing capability covers the requirements of a range of application needs. This includes the ability to test multiple slots for diagnosis and quality control purposes. List/Listless Programming allows the user to define multiple tests for a single set of chips. This makes the tests more efficient and effective by eliminating unnecessary loops or replication of tests. The Multi-Function Testing option offers the user the ability to test a variety of features simultaneously. This feature helps diagnose any issues quickly and accurately. In addition, the Multi-Function Testing ensures that all parameters are tested accurately and that no important feature is overlooked. ADVANTEST M 6761AD also features a Memory Counter for diagnostic purposes. The Memory Counter records a wide range of information, including the exact parameters of the tests. This allows engineers to quickly and accurately diagnose any issues with the device. In addition, M 6761AD also offers a Diagnostic Mode, allowing engineers to troubleshoot any issues more quickly and accurately. The Diagnostic Mode is also capable of providing extra information regarding the device if needed. This significantly increases the amount of time saved in debugging and testing integrated circuits. In conclusion, ADVANTEST M 6761AD is a full-featured device handler with a range of features and capabilities. The device offers maximum flexibility and versatility in testing operations, while maintaining accuracy and speed. It is an ideal solution for testing integrated circuits with ease and accuracy.