Used ADVANTEST M 6771AD #104178 for sale

ADVANTEST M 6771AD Handler, produced by the electronics manufacturer ADVANTEST Corporation, is an advanced wafer-level test handler designed for automated testing of semiconductor devices. It provides an ergonomic, efficient and reliable solution for testing devices including discrete components, standard circuit cards and other semi-finished products. ADVANTEST M6771AD Handler is designed with a high degree of flexibility, allowing the test process to be customized to the needs of specific types of devices. Different levels of operator interaction and decision-making can be programmed via the use of the Handler's programming software. The Handler also offers the flexibility of being able to accept a wide range of device package sizes, requiring minimal operator training and avoiding the need for extra tooling or manual manipulation of the samples. The Handler utilizes a robotic module for sample loading, unloading, and sample movement. The robot is servo controlled for precise movements and encoder feedback for fast and accurate positioning. The arm design allows for easy access to the sample during load and unload operations, ensuring minimal time spent on handling. The Handler is also equipped with a vision system for precise sample identification, offering the flexibility to handle different types of devices. The Handler is equipped with an advanced Multi-Product Board (MPB) interface, allowing multiple boards to be configured at once. This ensures increased throughput and efficiency in production. Additionally, the Handler has a flexible architecture allowing for direct communication with other test system components such as switches, supplies, boards, and testers. The Handler has two conveyors: one for loading in parts, and one for unloading. It supports both manual and automatic operations, depending on the complexity of the test job. The Handler features a high degree of flexibility for positioning and orientation of devices onto the test handlers, with an optional variable pitch arm for test head position adjustments. In addition, the Handler also includes a multi-zone test environment which allows for testing multiple devices concurrently in the same area. Overall, M6771 AD Handler provides a reliable and efficient solution for testing semiconductor devices, offering flexibility and durability. With the ability to configure multiple boards at once and direct communication with other test system components, it's perfect for manufacturers seeking a powerful and highly configurable test solution.